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X25F128 Datasheet, PDF (9/14 Pages) Xicor Inc. – SerialFlash™ Memory With Block Lock™ Protection
X25F128
EQUIVALENT A.C. LOAD CIRCUIT
2.7V
5V
1.64KΩ
OUTPUT
4.63KΩ
100pF
1.44KΩ
OUTPUT
1.95KΩ
100pF
6829 ILL F09.1
A.C. TEST CONDITIONS
Input Pulse Levels
Input Rise and Fall Times
VCC x 0.1 to VCC x 0.9
10ns
Input and Output Timing Level
VCC x 0.5
6829 PGM T11
A.C. CHARACTERISTICS (Over recommended operating conditions, unless otherwise specified)
Data Input Timing
Symbol
Parameter
Min.
Max.
fSCK
tCYC
tLEAD
tLAG
tWH
tWL
tSU
tH
tRI(4)
tFI(4)
tHD
tCD
tCS
tPC(5)
Clock Frequency
Cycle Time
CS Lead Time
CS Lag Time
Clock HIGH Time
Clock LOW Time
Data Setup Time
Data Hold Time
Data In Rise Time
Data In Fall Time
HOLD Setup Time
HOLD Hold Time
CS Deselect Time
Program Cycle Time
0
1
1000
500
500
400
400
100
100
2
2
200
200
2
10
Units
MHz
ns
ns
ns
ns
ns
ns
ns
µs
µs
ns
ns
µs
ms
6829 PGM T12.1
Data Output Timing
Symbol
Parameter
Min.
Max.
Units
fSCK
Clock Frequency
0
1
MHz
tDIS
Output Disable Time
500
ns
tV
Output Valid from Clock LOW
400
ns
tHO
tRO(4)
tFO(4)
tLZ(4)
tHZ(4)
Output Hold Time
Output Rise Time
Output Fall Time
HOLD HIGH to Output in Low Z
HOLD LOW to Output in High Z
0
ns
300
ns
300
ns
100
ns
100
ns
6829 PGM T13
Notes: (4) This parameter is periodically sampled and not 100% tested.
(5) tWC is the time from the rising edge of CS after a valid write sequence has been sent to the end of the self-timed internal
nonvolatile program cycle.
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