WCFS0808C1E Datasheet, PDF (3/10 Pages) Weida Semiconductor, Inc. – 32K x 8 Static RAM

AC Test Loads and Waveforms^[5]
5V
OUTPUT
R1 481Ω
5V
OUTPUT
R1 481Ω
30 pF
INCLUDING
JIG AND
SCOPE
R2
255 Ω
(a)
5 pF
R2
255Ω
INCLUDING
JIG AND
SCOPE
C199–5
(b)
WCFS0808C1E
3.0V
GND
10%
≤t_r
ALL INPUT PULSES
90%
90%
10%
≤t_r
Equivalent to:
THÉVENIN EQUIVALENT
OUTPUT
167 Ω
1.73V
Data Retention Characteristics (Over the Operating Range)
Parameter
Description
Conditions^[6]
V_DR
t_CDR[1]
t_R ^[5]
V_CC for Data Retention
Chip Deselect to Data Retention Time
Operation Recovery Time
V_CC = V_DR = 2.0V,
CE > V_CC – 0.3V,
V_IN > V_CC – 0.3V or
V_IN < 0.3V
Data Retention Waveform
DATA RETENTION MODE
V_CC
3.0V
V_DR > 2V
t_CDR
CE
Min.
Max.
Unit
2.0
V
0
ns
200
µs
3.0V
t_R
Note:
5. t_R< 3 ns for the -12 and the -15 speeds. t_R< 5 ns for the -20 and slower speeds
6. No input may exceed V_CC + 0.5V.
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