WCFS0808C1E Datasheet, PDF (2/10 Pages) Weida Semiconductor, Inc. – 32K x 8 Static RAM

WCFS0808C1E
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage to Ground Potential
(Pin 28 to Pin 14) ........................................... –0.5V to +7.0V
Operating Range
Range
Ambient Temperature^[2]
Commercial
0°C to +70°C
V_CC
5V ± 10%
DC Voltage Applied to Outputs
in High Z State^[1].................................... –0.5V to V_CC + 0.5V
DC Input Voltage^[1] ................................ –0.5V to V_CC + 0.5V
Output Current into Outputs (LOW)............................. 20 mA
Static Discharge Voltage........................................... >2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current.................................................... >200 mA
Electrical Characteristics Over the Operating Range^[3]
Parameter
V_OH
V_OL
V_IH
V_IL
I_IX
I_OZ
I_CC
I_SB1
I_SB2
Description
Test Conditions
Output HIGH
Voltage
V_CC = Min., I_OH=–4.0 mA
Output LOW
Voltage
V_CC = Min., I_OL=8.0 mA
Input HIGH
Voltage
Input LOW
Voltage
Input Load
Current
GND < V_I < V_CC
Output Leakage GND < V_O < V_CC,
Current
Output Disabled
V_CC Operating
Supply Current
Automatic CE
Power-Down
Current— TTL
Inputs
Automatic CE
Power-Down
Current— CMOS
Inputs
V_CC = Max.,
I_OUT = 0 mA,
f = f_MAX = 1/t_RC
Max. V_CC,
CE > V_IH,
V_IN > V_IH or
V_IN < V_IL, f = f_MAX
Max. V_CC,
CE > V_CC – 0.3V
V_IN > V_CC – 0.3V
or V_IN < 0.3V, f = 0
Com’l
Com’l
Com’l
WCFS0808C1E 12ns
Min.
Max.
2.4
0.4
2.2
–0.5
V_CC
+0.3V
0.8
–5
+5
–5
+5
160
30
10
]
Capacitance^[1]
Parameter
Description
Test Conditions
C_IN
C_OUT
Input Capacitance
Output Capacitance
T_A = 25°C, f = 1 MHz,
V_CC = 5.0V
Notes:
1. V_IL (min.) = –2.0V for pulse durations of less than 20 ns.
2. T_A is the “instant on” case temperature.
3. See the last page of this specification for Group A subgroup testing information.
4. Tested initially and after any design or process changes that may affect these parameters.
WCFS0808C1E 15ns
Min.
Max.
Unit
2.4
V
0.4
V
2.2
V_CC
V
+0.3V
–0.5
0.8
V
–5
+5
µA
–5
+5
µA
155
mA
30
mA
10
mA
Max.
Unit
8
pF
8
pF
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