2N5484_07 Datasheet, PDF (3/8 Pages) Vishay Siliconix – N-Channel JFETs

2N/SST5484 Series
Vishay Siliconix
SPECIFICATIONS FOR SST SERIES (T_A = 25_C UNLESS OTHERWISE NOTED)
Limits
SST5484
SST5485
SST5486
Parameter
Symbol
Test Conditions
Typ^b Min Max Min Max Min Max Unit
Static
Gate-Source
Breakdown Voltage
Gate-Source Cutoff Voltage
Saturation Drain Current^b
Gate Reverse Current
Gate Operating Current^c
Gate-Source
Forward Voltage^c
V_(BR)GSS
V_GS(off)
I_DSS
I_GSS
I_G
V_GS(F)
I_G = −1 mA , V_DS = 0 V
V_DS = 15 V, I_D = 10 nA
V_DS = 15 V, V_GS = 0 V
V_GS = −20 V, V_DS = 0 V
T_A = 100_C
V_DG = 10 V, I_D = 1 mA
I_G = 10 mA , V_DS = 0 V
−35
−25
−25
−25
V
−0.3 −3 −0.5 −4
−2
−6
1
5
4
10
8
20 mA
−0.002
−0.2
−1
−200
−1
−200
−1
nA
−200
−20
pA
0.8
V
Dynamic
Common-Source
Forward Transconductance^{NO TAG}
Common-Source
Output Conductance^{NO TAG}
Common-Source
Input Capacitance
Common-Source
Reverse Transfer
Capacitance
Common-Source
Output Capacitance
Equivalent Input
Noise Voltage^c
g_fs
g_os
C_iss
C_rss
C_oss
e_n
V_DS = 15 V, V_GS = 0 V
f = 1 kHz
V_DS = 15 V, V_GS = 0 V
f = 1 MHz
V_DS = 15 V, V_GS = 0 V
f = 100 Hz
3
6
3.5
7
4
8
mS
50
60
75
mS
2.2
0.7
pF
1
10
nV⁄
√Hz
High-Frequency
Common-Source
Transconductance
Y_fs
f = 100 MHz
5.5
f = 400 MHz
5.5
Common-Source
Output Conductance
Y_os
V_DS = 15 V
V_GS = 0 V
f = 100 MHz
45
f = 400 MHz
65
Common-Source
Input Conductance
Y_is
f = 100 MHz
0.05
f = 400 MHz
0.8
Common-Source
Power Gain
V_DS = 15 V, I_D = 1 mA
f = 100 MHz
20
G_ps
V_DS = 15 V
f = 100 MHz
21
I_D = 4 mA
f = 400 MHz
13
V_DS = 15 V, V_GS = 0 V
R_G = 1 MW, f = 1 kHz
0.3
Noise Figure
NF
V_DS = 15 V, I_D = 1 mA
R_G = 1 kW, f = 100 MHz
2
V_DS = 15 V
I_D = 4 mA
R_G = 1 kW
f = 100 MHz
1
f = 400 MHz
2.5
Notes
a. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
b. Pulse test: PW v300 ms duty cycle v3%.
c. This parameter not registered with JEDEC.
d. Not a production test.
mS
mS
mS
dB
NH
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 70246
S-50148—Rev. G, 24-Jan-05
www.vishay.com
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