SI7921DN Datasheet, PDF (2/5 Pages) Vishay Siliconix – Dual P-Channel 30-V (D-S) MOSFET

Si7921DN
Vishay Siliconix
New Product
SPECIFICATIONS T_J = 25°C, unless otherwise noted
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Static
Gate Threshold Voltage
V_GS(th)
V_DS = V_GS, I_D = –250 µA
–1.0
–3.0
V
Gate-Body Leakage
I_GSS
V_DS = 0 V, V_GS = ±20 V
±100
nA
Zero Gate Voltage Drain Current
I_DSS
V_DS = –30 V, V_GS = 0 V
V_DS = –30 V, V_GS = 0 V, T_J = 55°C
–1
µA
–5
On-State Drain Current^a
I_D(on)
V_DS ≤ –5 V, V_GS = –10 V
–20
A
Drain-Source On-State Resistance^{a r}DS(on)
V_GS = –10 V, I_D = –5.1 A
V_GS = –4.5 V, I_D = –3.8 A
0.050
0.063
Ω
0.085
0.110
Forward Transconductance^a
g_fs
V_DS = –15 V, I_D = –5.1 A
9
S
Diode Forward Voltage^a
V_SD
I_S = –2.1 A, V_GS = 0 V
–0.8
–1.2
V
Dynamic^b
Total Gate Charge
Q_g
10.5
16
Gate-Source Charge
Q_gs
V_DS = –15 V, V_GS = –10 V, I_D = –5.1 A
1.8
nC
Gate-Drain Charge
Q_gd
2.8
Gate Resistance
R_g
8.5
Ω
Turn-On Delay Time
t_d(on)
10
15
Rise Time
Turn-Off DelayTime
t_r
t_d(off)
V_DD = –15 V, R_L = 15 Ω
I_D ≅ –1 A, V_GEN = –10 V, R_G = 6 Ω
15
25
25
40
ns
Fall Time
t_f
20
30
Source-Drain Reverse Recovery Time t_rr
I_F = –2.1 A, di/dt = 100 A/µs
25
50
Notes
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
TYPICAL CHARACTERISTICS T_A = 25°C, unless otherwise noted
20
20
V_GS =10 thru 5 V
16
16
12
12
4V
8
8
4
4
3V
0
0
0
1
2
3
4
5
0
V_DS – Drain-to-Source Voltage (V)
Output Characteristics
www.vishay.com
2
T_C = –55˚C
25˚C
125˚C
1
2
3
4
5
V_GS – Gate-to-Source Voltage (V)
Transfer Characteristics
Document Number: 72341
S-51210–Rev. B, 27-Jun-05