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TC5565APL Datasheet, PDF (4/9 Pages) Toshiba Semiconductor – 65,536 bit static random access memory organized as 8,192 words by 8 bits using CMOS technology
TC5565APL-10, TC5565APL-12, TC5565APL-15
TC5565AFL-10, TC5565AFL-12, TC5565AFL-15
A.C. CHARACTERISTICS (Ta=0~70°C, VDD = 5V±10%)
Read Cycle
SYMBOL PARAMETER
tRC
Read Cycle Time
tACC
Address Access Time
tCOL
\CE1 Access Time
tC02
CE2 Access Time
tOE
Output Enable to Output Valid
tCOE
Chip Enable (\CE1, CE2) to
Output in Low-Z
tOEE
Output Enable to Output in Low-Z
tOD
Chip Enable (CE1, CE2) to
Output in High-Z
tODO
Output Enable to Output in High-Z
tOH
Output Data Hold Time
TC5565APL-10
TC5565AFL-10
MIN. MAX.
100
-
-
100
-
100
-
100
-
50
10
-
5
-
-
35
-
35
20
-
TC5565APL-12 TC5565APL-15
TC5565AFL-12 TC5565AFL-15
MIN. MAX. MIN. MAX
120
-
150
-
-
120
-
150
-
120
-
150
-
120
-
150
-
60
-
70
10
-
15
-
5
-
5
-
-
40
-
50
-
40
-
50
20
-
20
-
Write Cycle
SYMBOL
PARAMETER
tWC
Write Cycle Time
tWP
Write Pulse Width
tCW
Chip Selection to End of Write
tAS
Address Set up Time
rWR
Write Recovery Time
tODW
R/W to Output High-Z
rOEW
R/W to Output Low-Z
tDS
Data Set up Time
tDH
Data Hold Time
A.C. TEST CONDITION
TC5565APL-10
TC5565AFL-10
MIN. MAX.
100
-
60
-
80
-
0
-
0
-
-
35
5
-
40
-
0
-
TC5565APL-12 TC5565APL- 5
TC5565AFL-12 TC5565AFL- 5
MIN. MAX. MIN. MAX..
120
-
150
-
70
-
90
-
85
-
100
-
0
-
0
-
0
-
0
-
0
40
-
50
5
-
10
-
50
-
60
-
0
-
0
-
Output Load
Input Pulse Level
Timing Measurement
Reference Level
tr, tf
VIN
VOUT
: 100pF + 1 TTL Gate
: 0.6V, 2.4V
: 0.8V, 2.2V
: 0.8V, 2.2V
: 5ns