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SSM6J216FE_14 Datasheet, PDF (2/9 Pages) Toshiba Semiconductor – MOSFETs Silicon P-Channel MOS (U-MOSVI)
SSM6J216FE
4. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25)
Characteristics
Symbol
Rating
Unit
Drain-source voltage
VDSS
-12
V
Gate-source voltage
VGSS
±8
Drain current (DC)
(Note 1)
ID
-4.8
A
Drain current (pulsed)
(Note 1),(Note 2)
IDP
-11
Power dissipation
(t = 10 s)
(Note 2)
PD
700
mW
Power dissipation
(Note 2)
PD
500
mW
Channel temperature
Tch
150

Storage temperature
Tstg
-55 to 150
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Ensure that the channel temperature does not exceed 150.
Note 2: Device mounted on an FR4 board.(25.4 mm × 25.4 mm × 1.6 mm, Cu Pad: 645 mm2)
Note:
Note:
The MOSFETs in this device are sensitive to electrostatic discharge. When handling this device, the worktables,
operators, soldering irons and other objects should be protected against anti-static discharge.
The channel-to-ambient thermal resistance, Rth(ch-a), and the power dissipation, PD, vary according to the
board material, board area, board thickness and pad area. When using this device, be sure to take heat
dissipation fully into account.
2
2014-03-12
Rev.3.0