TC94A09F Datasheet, PDF (16/19 Pages) Toshiba Semiconductor – Single-Chip CD Processor with Built-in Controller

AD converter (ADin1~ADin4)
Characteristics
Analog input voltage range
Resolution
Total conversion error
Analog input leakage
Test
Symbol _Circuit
Test Condition
V_AD
¾ ADin1~ADin4
VRES ¾
¾
¾
¾
¾
I_LI
¾ V_IH = 5.0 V, V_IL = 0 V (ADin1~ADin4)
TC94A09F
Min Typ. Max Unit
0
~ MV_DD V
¾
6
¾
bit
¾ ±0.5 ±1.0 LSB
¾
¾ ±1.0 mA
DOUT, SBSY, SBOK, SEL, OT19/ _HSO , OT20/SPCK, OT21/SPDA, OT22/COFS output
Characteristics
Symbol
Test
Circuit
Test Condition
Min Typ. Max Unit
Output current
“H” level
“L” level
I_OH4
I_OL4
¾ V_OH = 4.5 V
¾ V_OL = 0.5 V
-1.5 -4.0 ¾
mA
1.5
4.0
¾
PDO, TMAX, RFGC, TEBC, FMO, DMO, TRO, FOO output
Characteristics
Output current
“H” level
“L” level
Output resistance
V_REF output resistance
Symbol
Test
Circuit
Test Condition
Min Typ. Max Unit
I_OH6
¾ V_OH = 3.8 V, P2V_REF = 4.2 V (PDO, TMAX) ¾ -2.0 ¾
mA
I_OL4
¾ V_OL = 0.5 V, P2V_REF = 4.2 V (PDO, TMAX) ¾
6.0
¾
R_out3
¾ (RFGC, TEBC, FMO, DMO, TRO, FOO)
¾
3.3
¾
kW
V_oref
¾
(RFGC, TEBC, FMO, DMO, PDD)
V_REF = PV_REF = 2.1 V
¾
2.1
¾
V
Transfer delay time (AOUT, SPDA, DATA, SBSY, SBOK)
Characteristics
Transfer delay
time
“H” level
“L” level
Symbol
Test
Circuit
t_pLH
¾
t_pHL
¾
Test Condition
¾
¾
Min Typ. Max Unit
¾
10
¾
ns
¾
10
¾
1-bit DA converter
Characteristics
Total harmony distortion
S/N ratio
Dynamic range
Crosstalk
Analog output level
Test
Symbol _Circuit
Test Condition
THD + N ¾ 1 kHz sine wave, full-scale input
S/N
¾
¾
DR
¾ 1 kHz sine wave, -60dB input conversion
CT
¾ 1 kHz sine wave, full-scale input
DAC_out ¾ 1 kHz sine wave, full-scale input
Min Typ. Max Unit
¾
90
85
¾
1200
-85
98
90
-90
1250
-78
¾
dB
¾
-85
1300 mVrms
16
2001-10-15