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| BQ28Z560-R1_14 Datasheet, PDF (8/61 Pages) Texas Instruments – Single Cell Li-Ion Battery Gas Gauge | |||
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bq28z560-R1
Not Recommended For New Designs
SLUSBD3 â APRIL 2013
www.ti.com
INTERNAL TEMPERATURE SENSOR CHARACTERISTICS
TA = â40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
GTEMP
Temperature sensor voltage gain
â2.0
mV/°C
HIGH FREQUENCY OSCILLATOR
TA = â40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
f(OSC)
f(EIO)
t(SXO)
Operating frequency
Frequency error (1), (2)
Start-up time (3)
TA = 0°C to 60°C
TA = â20°C to 70°C
TA = â40°C to 85°C
2.097
MHz
â2.0
0.38
2.0
%
â3.0
0.38
3.0
%
â4.5
0.38
4.5
%
2.5
5
ms
(1) The frequency error is measured from 2.097 MHz.
(2) The frequency drift is included and measured from the trimmed frequency at VCC = 2.5 V, TA = 25°C.
(3) The startup time is defined as the time it takes for the oscillator output frequency to be ±3%.
LOW FREQUENCY OSCILLATOR
TA = â40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
f(LOSC)
f(LEIO)
t(LSXO)
Operating frequency
Frequency error (1), (2)
Start-up time (3)
TA = 0°C to 60°C
TA = â20°C to 70°C
TA = â40°C to 85°C
32.768
kHz
â1.5
0.25
1.5
%
â2.5
0.25
2.5
%
â4.0
0.25
4.0
%
500
μs
(1) The frequency drift is included and measured from the trimmed frequency at VCC = 2.5 V, TA = 25°C.
(2) The frequency error is measured from 32.768 kHz.
(3) The startup time is defined as the time it takes for the oscillator output frequency to be ±3%.
INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS
TA = â40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VIN(SR)
tCONV(SR)
Input voltage range, V(SRN) and
V(SRP)
Conversion time
Resolution
VSR = V(SRN) â V(SRP)
Single conversion
â0.125
0.125
V
1
s
14
15
bits
VOS(SR)
INL
ZIN(SR)
Ilkg(SR)
Input offset
Integral non-linearity error
Effective input resistance(1)
Input leakage current(1)
10
µV
±0.007 ±0.034 FSR
2.5
Mâ¦
0.3
µA
(1) Specified by design. Not production tested.
ADC (TEMPERATURE AND CELL VOLTAGE) CHARACTERISTICS
TA = â40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VIN(ADC)
tCONV(ADC)
Input voltage range
Conversion time
Resolution
â0.2
1
V
125
ms
14
15
bits
VOS(ADC)
Input offset
1
mV
8
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Copyright © 2013, Texas Instruments Incorporated
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