BQ28Z560-R1_14 Datasheet, PDF (5/61 Pages) Texas Instruments – Single Cell Li-Ion Battery Gas Gauge

www.ti.com
Not Recommended For New Designs
bq28z560-R1
SLUSBD3 – APRIL 2013
BLOCK DIAGRAM
BAT
0.1 µF
VREG
0.1 µF
Vss
Linear
Regulator 2 .5 V
TEST Reset*
SRN
Oscillator
System Clock
System Clocks
Overcharge
Current
Comparator
Overload
Comparator
Short Circuit
Comparator
Overcharge
Comparator
Over Discharge
Comparator
Input /Output
Oscillator
BAT
TEST _SDA
Protection
Logic Control
Event
(RA0)
Interrupt
Controller
BAT
VSS
VM
BAT
VSS
VSS
CoolRISC
CPU
PMAddr
(15-bit)
PMInst
(22-bit)
Program Memory
16 k x 22 FLASH
AND
6 k x 22 Mask ROM
Data Memory
1k x 8 SRAM
AND
1k x 8 FLASH
Data (8-bit)
DMAddr (16-bit)
System I/O (13-bit)
DATA
Analog Front End
Delta-Sigma ADC
AND
Integrating
Coulomb Counter
AD0–3 (RC0–3)
Communications
I2C (slave)
Peripherals
Figure 3. Block Diagram
PACK+
VM
510
COUT
DOUT
VREG
GPIO ^3k
PACK–
0.1 µF
+
0.1 µF
TS
10k
0.47µF
SRP
0. 1 µF
100
0.1µF 10 mΩ
SRN
0.1 µF ¹⁰⁰
SDA 100
100
SCL
100
5V6
100
5V6
SDA
SCL
ABSOLUTE MAXIMUM RATINGS
All voltages are referenced to the VSS pin. Over operating free-air temperature range (unless otherwise noted) ⁽¹⁾
PARAMETER
VALUE
UNIT
V_BAT
V_VM
V_COUT
V_DOUT
V_IOD
V_SDATA
V_SCLK
ESD
Input voltage, BAT (Pin 4)
VM terminal voltage (Pin 3)
COUT terminal input voltage (Pin 2)
DOUT terminal input voltage (Pin 1)
All other pins (Pins 5, 7, 8, 9, and 12)
SDA (Pin 10)
SCL (Pin 11)
Human body model
–0.3 to 12
V
V_BAT – 32 to V_BAT + 0.3
V
V_BAT – 32 to V_BAT + 0.3
V
V_SS – 0.3 to V_BAT + 0.3
V
–0.3 to 6
V
V_SS – 0.3 to V_BAT + 0.3
V
V_SS – 0.3 to V_BAT + 0.3
V
±2
kV
ESD
Machine model
±200
V
T_A
Operating free-air temperature range
T_stg
Storage temperature range
–40°C to 85
°C
–65°C to 150
°C
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq28z560-R1
Submit Documentation Feedback
5