LMH6622 Datasheet, PDF (6/33 Pages) National Semiconductor (TI) – Dual Wideband, Low Noise, 160MHz, Operational Amplifiers

LMH6622
SNOS986E – DECEMBER 2001 – REVISED JULY 2014
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±6 V Electrical Characteristics (continued)
Unless otherwise specified, T_J = 25°C, V⁺ = 6 V, V^− = −6 V, V_CM = 0 V, A_V = +2, R_F = 500 Ω, R_L = 100 Ω. Some limits apply at
the temperature extremes as noted in the table.
PARAMETER
TEST CONDITIONS
TEMPERATURE
EXTREMES
MIN ⁽¹⁾ TYP ⁽²⁾ MAX⁽¹⁾
ROOM
TEMPERATURE
MIN⁽¹⁾ TYP⁽²⁾ MAX⁽¹⁾
UNIT
TRANSFER CHARACTERISTICS
A_VOL Large Signal Voltage Gain
X_t
Crosstalk
OUTPUT CHARACTERISTICS
V_O = 4 V_PP
f = 1 MHz
70
74
83
dB
−75
dB
V_O
Output Swing
No Load, Positive Swing
4.6
No Load, Negative Swing
R_L = 100 Ω, Positive Swing
3.8
R_L = 100 Ω, Negative Swing
R_O
Output Impedance
f = 1 MHz
I_SC
Output Short Circuit
Current
Sourcing to Ground
ΔV_IN = 200 mV⁽⁵⁾,⁽⁶⁾
Sinking to Ground
ΔV_IN = −200 mV⁽⁵⁾,⁽⁶⁾
I_OUT
Output Current
Sourcing, V_O = +4.3 V
Sinking, V_O = −4.3 V
POWER SUPPLY
4.8
5.2
−4.4
−5.0 −4.6
V
4.0
4.6
−3.8
−4.6
−4
0.08
Ω
100
135
mA
100
130
90
mA
+PSRR Positive Power Supply
Rejection Ratio
−PSRR Negative Power Supply
Rejection Ratio
I_S
Supply Current (per
amplifier)
Input Referred,
V_S = +5 V to +6 V
Input Referred,
V_S = −5 V to −6 V
No Load
74
80
95
dB
69
75
90
6.5
4.3
6 ^mA
(5) Applies to both single-supply and split-supply operation. Continuous short circuit operation at elevated ambient temperature can result in
exceeding the maximum allowed junction temperature of 150°C.
(6) Short circuit test is a momentary test. Output short circuit duration is infinite for V_S ≤ ±2.5 V, at room temperature and below. For V_S >
±2.5 V, allowable short circuit duration is 1.5ms.
6.6 ±2.5 V Electrical Characteristics
Unless otherwise specified, T_J = 25°C, V+ = 2.5 V, V− = −2.5 V, V_CM = 0 V, A_V = +2, R_F = 500 Ω, R_L = 100 Ω. Some limits
apply at the temperature extremes as noted in the table.
PARAMETER
TEST CONDITIONS
TEMPERATURE
EXTREMES
MIN ⁽¹⁾ TYP ⁽²⁾ MAX⁽¹⁾
ROOM
TEMPERATURE
MIN⁽¹⁾ TYP⁽²⁾ MAX⁽¹⁾
UNIT
DYNAMIC PERFORMANCE
f_CL
−3 dB BW
BW_0.1dB 0.1dB Gain Flatness
SR
Slew Rate ⁽³⁾
T_S
Settling Time
T_r
Rise Time
T_f
Fall Time
V_O = 200 mV_PP
V_O = 200 mV_PP
V_O = 2 V_PP
V_O = 2 V_PP to ±0.1%
V_O = 2 V_PP to ±1.0%
V_O = 0.2 V Step, 10% to 90%
V_O = 0.2 V Step, 10% to 90%
150
MHz
20
MHz
80
V/μs
45
ns
40
2.5
ns
2.5
ns
(1) All limits are specified by testing or statistical analysis.
(2) Typical values represent the most likely parametric norm.
(3) Slew rate is the slowest of the rising and falling slew rates.
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