LMH6622 Datasheet, PDF (5/33 Pages) National Semiconductor (TI) – Dual Wideband, Low Noise, 160MHz, Operational Amplifiers

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LMH6622
SNOS986E – DECEMBER 2001 – REVISED JULY 2014
6.5 ±6 V Electrical Characteristics
Unless otherwise specified, T_J = 25°C, V⁺ = 6 V, V^− = −6 V, V_CM = 0 V, A_V = +2, R_F = 500 Ω, R_L = 100 Ω. Some limits apply at
the temperature extremes as noted in the table.
PARAMETER
TEST CONDITIONS
TEMPERATURE
EXTREMES
MIN ⁽¹⁾ TYP ⁽²⁾ MAX⁽¹⁾
ROOM
TEMPERATURE
MIN⁽¹⁾ TYP⁽²⁾ MAX⁽¹⁾
UNIT
DYNAMIC PERFORMANCE
f_CL
−3dB BW
V_O = 200 mV_PP
BW_0.1dB 0.1dB Gain Flatness
SR
Slew Rate⁽³⁾
V_O = 20 0mV_PP
V_O = 2 V_PP
TS
Settling Time
V_O = 2 V_PP to ±0.1%
V_O = 2 V_PP to ±1.0%
Tr
Rise Time
V_O = 0.2 V Step, 10% to 90%
Tf
Fall Time
V_O = 0.2 V Step, 10% to 90%
DISTORTION and NOISE RESPONSE
160
MHz
30
MHz
85
V/μs
40
ns
35
2.3
ns
2.3
ns
e_n
Input Referred Voltage
f = 100 kHz
Noise
1.6
nV/√Hz
i_n
Input Referred Current
f = 100 kHz
Noise
1.5
pA/√Hz
DG
DP
HD2
Differential Gain
Differential Phase
2^nd Harmonic Distortion
HD3 3^rd Harmonic Distortion
MTPR Upstream
Downstream
R_L = 150 Ω, R_F = 470 Ω, NTSC
R_L = 150 Ω, R_F = 470 Ω, NTSC
f_c = 1 MHz, V_O = 2 V_PP,
R_L = 100 Ω
f_c = 1 MHz, V_O = 2 V_PP,
R_L = 500 Ω
f_c = 1 MHz, V_O = 2 V_PP,
R_L = 100 Ω
f_c = 1 MHz, V_O = 2 V_PP,
R_L = 500 Ω
V_O = 0.6 V_RMS,
26 kHz to 132 kHz
(see Figure 33)
V_O = 0.6 V_RMS,
144 kHz to 1.1 MHz
(see Figure 33)
0.03%
0.03
deg
−90
dBc
−100
−94
dBc
−100
−78
dBc
−70
INPUT CHARACTERISTICS
V_OS
TC V_OS
I_OS
I_B
R_IN
Input Offset Voltage
Input Offset Average Drift
Input Offset Current
Input Bias Current
Input Resistance
V_CM = 0 V
V_CM = 0 V ⁽⁴⁾
V_CM = 0V
V_CM = 0V
Common Mode
Differential Mode
−2
−1.5
+2 −1.2 +0.2 +1.2 mV
−2.5
μV/°C
1.5
−1 −0.04
1 μA
15
4.7
10 μA
17
MΩ
12
kΩ
C_IN
Input Capacitance
Common Mode
Differential Mode
0.9
pF
1.0
pF
CMVR Input Common Mode
Voltage Range
CMRR ≥ 60dB
−4.75 −4.5
V
5.5 +5.7
CMRR Common-Mode Rejection Input Referred,
Ratio
V_CM = −4.2 V to +5.2 V
75
80
100
dB
(1) All limits are specified by testing or statistical analysis.
(2) Typical values represent the most likely parametric norm.
(3) Slew rate is the slowest of the rising and falling slew rates.
(4) Offset voltage average drift is determined by dividing the change in V_OS at temperature extremes into the total temperature change.
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