LMH6550 Datasheet, PDF (6/33 Pages) National Semiconductor (TI) – Differential, High Speed Op Amp

LMH6550
SNOSAK0I – DECEMBER 2004 – REVISED JANUARY 2015
www.ti.com
7.6 Electrical Characteristics: 5 V⁽¹⁾
Single-ended in differential out, T_A = 25°C, A_V = +1, V_S = 5 V, V_CM = 2.5 V, R_F = R_G = 365 Ω, R_L = 500 Ω; unless specified.
PARAMETER
TEST CONDITIONS
MIN ⁽²⁾ TYP ⁽³⁾ MAX ⁽²⁾ UNIT
SSBW
LSBW
Small Signal −3 dB Bandwidth
Large Signal −3 dB Bandwidth
0.1 dB Bandwidth
Slew Rate
R_L = 500 Ω, V_OUT = 0.5 V_PP
R_L = 500 Ω, V_OUT = 2 V_PP
2-V Step ⁽⁴⁾
350
330
60
1500
MHz
MHz
MHz
V/μs
Rise/Fall Time, 10% to 90%
1-V Step
1
ns
Settling Time
1-V Step, 0.05%
12
ns
V_CM PIN AC PERFORMANCE (COMMON-MODE FEEDBACK AMPLIFIER)
Common-Mode Small Signal
Bandwidth
185
MHz
Slew Rate
180
V/μs
DISTORTION AND NOISE RESPONSE
HD2
2^nd Harmonic Distortion
HD3
3^rd Harmonic Distortion
e_n
Input Referred Noise Voltage
i_n
Input Referred Noise Current
INPUT CHARACTERISTICS (DIFFERENTIAL)
V_O = 2 V_PP, f = 5 MHz, R_L = 800 Ω
V_O = 2 V_PP, f = 20 MHz, R_L = 800 Ω
V_O = 2 V_PP, f = 5 MHz, R_L = 800 Ω
V_O = 2 V_PP, f = 20 MHz, R_L = 800 Ω
f ≥ 1 MHz
f ≥ 1 MHz
−89
dBc
−88
−85
dBc
−70
6.0
nV/√Hz
1.5
pA/√Hz
V_OSD
Input Offset Voltage
I_BIAS
Input Offset Voltage Average
Temperature Drift
Input Bias Current
Input Bias Current Average
Temperature Drift
Differential Mode, V_ID =
0, V_CM = 0
(5)
At extreme
temperatures
(6)
(5)
1
±4 mV
±6
1.6
µV/°C
0
−8
−16
μA
9.5
nA/°C
Input Bias Current Difference
Difference in Bias Currents Between the
Two Inputs
0.3
µA
CMRR
Common-Mode Rejection Ratio
Input Resistance
DC, V_ID = 0 V
Differential
70
80
dBc
5
MΩ
Input Capacitance
Differential
1
pF
V_ICM
Input Common-Mode Range
CMRR > 53 dB
+3.1
+3.2
+0.4
+0.3
V_CM PIN INPUT CHARACTERISTICS (COMMON-MODE FEEDBACK AMPLIFIER)
Input Offset Voltage
Common-Mode, V_ID = 0
At extreme
temperatures
1
±5 mV
±8
Input Offset Voltage Average
Temperature Drift
18.6
µV/°C
Input Bias Current
3
μA
V_CM CMRR
Input Resistance
V_ID = 0,
70
75
dB
1-V Step on V_CM Pin, Measure V_OD
V_CM Pin to Ground
25
kΩ
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T_J = T_A.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlation using
Statistical Quality Control (SQC) methods.
(3) Typical numbers are the most likely parametric norm.
(4) Slew Rate is the average of the rising and falling edges.
(5) Drift determined by dividing the change in parameter at temperature extremes by the total temperature change.
(6) Negative input current implies current flowing out of the device.
6
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