TCAN1042-Q1_17 Datasheet, PDF (5/40 Pages) Texas Instruments – Automotive Fault Protected CAN Transceiver with CAN FD

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TCAN1042-Q1, TCAN1042V-Q1, TCAN1042H-Q1
TCAN1042HV-Q1, TCAN1042G-Q1, TCAN1042GV-Q1
TCAN1042HG-Q1, TCAN1042HGV-Q1
SLLSES9B – FEBRUARY 2016 – REVISED MAY 2017
7 Specifications
7.1 Absolute Maximum Ratings^{(1) (2)}
MIN
V_CC
5-V bus supply voltage range
–0.3
V_IO
I/O Level Shifting Voltage Range
Devices with the "V" suffix
–0.3
V_BUS
CAN Bus I/O voltage range
(CANH, CANL)
Devices without the "H" suffix
–58
V_(Diff)
Max differential voltage between
CANH and CANL
Devices without the “H” suffix
–58
V_BUS
CAN Bus I/O voltage range
(CANH, CANL)
Devices with the "H" suffix
–70
V_(Diff)
Max differential voltage between
CANH and CANL
Devices with the “H” suffix
–70
V_{(Logic_Input)}
V_{(Logic_Output)}
I_O(RXD)
T_J
T_STG
Logic input terminal voltage range (TXD, STB)
Logic output terminal voltage range (RXD)
RXD (Receiver) output current
Virtual junction temperature range (see Thermal Information)
Storage temperature range (see Thermal Information)
–0.3
–0.3
–8
–55
–65
MAX
7
7
58
58
70
70
7 and V_I ≤ V_IO + 0.3
7 and V_I ≤ V_IO + 0.3
8
150
150
UNIT
V
V
V
V
V
V
V
V
mA
°C
°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to ground terminal.
7.2 ESD Ratings
D (SOIC) Package
Human Body Model (HBM) ESD stress voltage
Charged Device Model (CDM) ESD stress voltage
Machine Model (MM)
System Level Electro-Static Discharge (ESD)
System Level Electro-Static Discharge (ESD)
System Level Electrical fast transient (EFT)
ISO7637-2 Transients according to GIFT - ICT CAN EMC test
specification ⁽⁵⁾
ISO7637-3 Transients
DRB (VSON) Package
Human Body Model (HBM) ESD stress voltage
Charged Device Model (CDM) ESD stress voltage
Machine Model (MM)
TEST CONDITIONS
All terminals⁽¹⁾
CAN bus terminals (CANH, CANL) to GND⁽²⁾
All terminals⁽³⁾
All terminals⁽⁴⁾
CAN bus terminals
(CANH, CANL) to GND
SAE J2962-2 per ISO 10605:
Powered Air Discharge
SAE J2962-2 per ISO 10605:
Powered Contact Discharge
CAN bus terminals
(CANH, CANL) to GND
IEC 61000-4-2: Unpowered
Contact Discharge
IEC 61000-4-2: Powered on
Contact Discharge
CAN bus terminals
(CANH, CANL) to GND
IEC 61000-4-4: Criteria A
Pulse 1
CAN bus terminals
Pulse 2
(CANH, CANL) to GND _{Pulse 3a}
Pulse 3b
CAN bus terminals
(CANH, CANL) to GND
Direct Coupling Capacitor "Slow
Transient Pulse" with 100 nF
coupling capacitor - Powered
All terminals⁽¹⁾
CAN bus terminals (CANH, CANL) to GND⁽²⁾
All terminals⁽³⁾
All terminals⁽⁴⁾
VALUE
±6000
±16000
±1500
±200
±15000
±8000
±15000
±8000
±4000
–100
+75
–150
+100
±85
±6000
±16000
±1500
±200
UNIT
V
V
V
V
V
V
V
V
(1) Tested in accordance to JEDEC Standard 22, Test Method A114.
(2) Test method based upon JEDEC Standard 22 Test Method A114, CAN bus is stressed with respect to GND.
(3) Tested in accordance to JEDEC Standard 22, Test Method C101.
(4) Tested in accordance to JEDEC Standard 22, Test Method A115.
(5) ISO7637 is a system level transient test. Results given here are specific to the GIFT-ICT CAN EMC Test specification conditions.
Different system level configurations may lead to different results.
Copyright © 2016–2017, Texas Instruments Incorporated
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Product Folder Links: TCAN1042-Q1 TCAN1042V-Q1 TCAN1042H-Q1 TCAN1042HV-Q1 TCAN1042G-Q1
TCAN1042GV-Q1 TCAN1042HG-Q1 TCAN1042HGV-Q1