LMH2180_14 Datasheet, PDF (5/22 Pages) Texas Instruments – 75 MHz Dual Clock Buffer

LMH2180
www.ti.com
SNAS419C – JANUARY 2008 – REVISED AUGUST 2011
5V Electrical Characteristics (continued)
Unless otherwise specified, all limits are specified for T_A = 25°C, V_DD = 5V, V_SS = 0V, V_CM = 1V, Enable_1,2 = V_DD, C_L = 10 pF,
R_L = 30 kΩ, Load is connected to V_SS, C_COUPLING = 10 nF. Boldface limits apply at temperature range extremes of operating
condition.⁽¹⁾
Parameter
Test Conditions
Min ⁽²⁾
Typ ⁽³⁾ Max ⁽²⁾
Units
e_n
I_SOLATION
CT
Input-Referred Voltage Noise
Output to Input
Crosstalk Rejection
Time Domain Response
f = 1 MHz, R_SOURCE = 50Ω
f = 1 MHz, R_SOURCE = 50Ω
f = 38.4 MHz, P_IN = 0 dBm
12
nV/√Hz
84
dB
59
dB
t_r
Rise Time
t_f
Fall Time
t_s
Settling Time to 0.1%
OS
Overshoot
SR
Slew Rate ⁽⁴⁾
Static DC Performance
0.1 V_PP Step (10-90%)
1 V_PP Step
0.1V_PP Step
V_IN = 2 V_PP
6
ns
6
ns
70
ns
13
%
124
V/µs
I_S
Supply Current
Enable_1,2 = V_DD ; No Load
3.4
4.0
4.1
mA
Enable₁ = V_DD, Enable₂ = V_SS ; No
Load
1.8
2.2
2.3
mA
Enable_1,2 = V_SS ; No Load
32
43
49
μA
PSRR
Power Supply Rejection Ratio
DC (3.0V to 5.0V)
65
64
68
dB
A_CL
Small Signal Voltage Gain
V_OS
Output Offset Voltage
V_IN = 0.2 V_PP
0.95
1.0
1.05
V/V
−1.4
21
22
mV
TC V_OS
Temperature Coefficient Output Offset
Voltage ⁽⁵⁾
2.4
µV/°C
R_OUT
Output Resistance
f = 100 kHz
f = 38.4 MHz
0.5
126
Ω
disabled
High Impedance
Miscellaneous Performance
R_IN
Input Resistance per Buffer
Enable = V_DD
Enable = V_SS
138
kΩ
138
C_IN
Input Capacitance per Buffer
Enable = V_DD
Enable = V_SS
1.3
pF
1.3
Z_IN
Input Impedance
f = 38.4 MHz, Enable = V_DD
f = 38.4 MHz, Enable = V_SS
4.3
kΩ
4.2
V_O
Output Swing Positive
V_IN = V_DD
4.96
4.95
4.99
V
Output Swing Negative
V_IN = V_SS
I_SC
Output Short-Circuit Current ⁽⁶⁾⁽⁷⁾
Sourcing, V_IN = V_DD, V_OUT = V_SS
Sinking, V_IN = V_SS, V_OUT = V_DD
10
35
50
mV
−80
−62
−90
mA
60
43
65
V_{en_hmin}
V_{en_lmax}
Enable High Active Minimum Voltage
Enable Low Inactive Maximum Voltage
1.2
V
0.6
(4) Slew rate is the average of the rising and falling slew rates.
(5) Average Temperature Coefficient is determined by dividing the changing in a parameter at temperature extremes by the total
temperature change.
(6) Short−Circuit test is a momentary test. Continuous short circuit operation at elevated ambient temperature can result in exceeding the
maximum allowed junction temperature of 150°C.
(7) Positive current corresponds to current flowing into the device.
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