LMH2180_14 Datasheet, PDF (4/22 Pages) Texas Instruments – 75 MHz Dual Clock Buffer

LMH2180
SNAS419C – JANUARY 2008 – REVISED AUGUST 2011
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2.7V Electrical Characteristics (continued)
Unless otherwise specified, all limits are specified for T_A = 25°C, V_DD = 2.7V, V_SS = 0V, V_CM = 1V, Enable_1,2 = V_DD, C_L = 10
pF, R_L = 30 kΩ, Load is connected to V_SS, C_COUPLING = 10 nF. Boldface limits apply at temperature range extremes of
operating condition.⁽¹⁾
Parameter
Test Conditions
Min ⁽²⁾
Typ ⁽³⁾ Max ⁽²⁾
Units
A_CL
Small Signal Voltage Gain
V_OS
Output Offset Voltage
V_IN = 0.2 V_PP
0.95
1.0
1.05
V/V
-0.5
17
18
mV
TC V_OS
Temperature Coefficient Output Offset
Voltage ⁽⁵⁾
2.8
µV/°C
R_OUT
Output Resistance
f = 100 kHz
f = 38.4 MHz
0.6
166
Ω
disabled
High Impedance
Miscellaneous Performance
R_IN
Input Resistance per Buffer
Enable = V_DD
Enable = V_SS
137
kΩ
137
C_IN
Input Capacitance per Buffer
Enable = V_DD
Enable = V_SS
1.3
pF
1.3
Z_IN
Input Impedance
f = 38.4 MHz, Enable = V_DD
f = 38.4 MHz, Enable = V_SS
4.5
kΩ
4.2
V_O
Output Swing Positive
V_IN = V_DD
2.66
2.65
2.69
V
Output Swing Negative
V_IN = V_SS
I_SC
Output Short-Circuit Current ⁽⁶⁾⁽⁷⁾
Sourcing, V_IN = V_DD, V_OUT = V_SS
Sinking, V_IN = V_SS, V_OUT = V_DD
19
35
37
mV
−21
−18
−25
mA
23
15
25
V_{en_hmin}
V_{en_lmax}
Enable High Active Minimum Voltage
Enable Low Inactive Maximum Voltage
1.2
V
0.6
(5) Average Temperature Coefficient is determined by dividing the changing in a parameter at temperature extremes by the total
temperature change.
(6) Short−Circuit test is a momentary test. Continuous short circuit operation at elevated ambient temperature can result in exceeding the
maximum allowed junction temperature of 150°C.
(7) Positive current corresponds to current flowing into the device.
5V Electrical Characteristics
Unless otherwise specified, all limits are specified for T_A = 25°C, V_DD = 5V, V_SS = 0V, V_CM = 1V, Enable_1,2 = V_DD, C_L = 10 pF,
R_L = 30 kΩ, Load is connected to V_SS, C_COUPLING = 10 nF. Boldface limits apply at temperature range extremes of operating
condition. ⁽¹⁾
Parameter
Test Conditions
Min ⁽²⁾
Typ ⁽³⁾ Max ⁽²⁾
Units
Frequency Domain Response
SSBW
LSBW
GFN
Small Signal Bandwidth
Large Signal Bandwidth
Gain Flatness < 0.1 dB
V_IN = 100 mV_PP; −3 dB
V_IN = 1.0 V_PP; −3 dB
f > 100 kHz
87
MHz
68
MHz
25
MHz
Distortion and Noise Performance
φ_n
Phase Noise
V_IN = 1 V_PP, f_C = 38.4 MHz, Δf = 1 kHz
V_IN = 1 V_PP, f_C = 38.4 MHz, Δf = 10
kHz
−123
−132
dBc/Hz
dBc/Hz
(1) The Electrical Characteristics tables list specifications under the listed Recommended Operating Conditions except as otherwise
modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and are not
specified.
(2) Datasheet min/max specification limits are specified by test or statistical analysis.
(3) Typical values represent the most likely parametric norms at T_A = +25°C, and at the Recommended Operation Conditions at the time of
product characterization and are not specified.
4
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