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SLAU443 Datasheet, PDF (49/68 Pages) Texas Instruments – EEG Front-End Performance Demonstration Kit
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Test Options on the EVM
8.5 Internally Generated Test Signal and Other Multiplexer Inputs
ADS1299 internally generates a test signal that can be used for signal integrity check. Also the multiplexer
provides options to measure supply voltage, temperature, etc. Details of these inputs can be found in
Section 5.3.
8.6 Arbitrary Input Signal
Any input signal can be fed to the device on connector J6 as described in Section 4.6. Figure 58 shows
the results obtained when a single ended sinusoidal signal is applied to AIN1 by following the steps
described in Section 4.6.2.
Figure 58. Scope Tab with Sinusoidal Inputs on AIN1
SLAU443 – May 2012
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