SLAU443 Datasheet, PDF (45/68 Pages) Texas Instruments – EEG Front-End Performance Demonstration Kit

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Test Options on the EVM
Figure 53. Global Register Settings for External Input Short Test
Figure 54. Scope Showing Noise for Input Short with 5k Resistors
SLAU443 – May 2012
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EEG Front-End Performance Demonstration Kit
45
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