OPA4317 Datasheet, PDF (4/30 Pages) Texas Instruments – Low-Offset, Rail-to-Rail I/O Operational Amplifier

OPA317
OPA2317
OPA4317
SBOS682A – MAY 2013 – REVISED JUNE 2013
www.ti.com
ELECTRICAL CHARACTERISTICS: V_S = +1.8 V to +5.5 V
At T_A = +25°C, R_L = 10 kΩ connected to midsupply, V_CM = V_OUT = midsupply, unless otherwise noted.
OPA317, OPA2317, OPA4317
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
OFFSET VOLTAGE
V_OS
dV_OS/dT
PSRR
Input offset voltage
vs temperature
vs power supply
Long-term stability⁽¹⁾
V_S = +5 V
T_A = –40°C to +125°C, V_S = +5 V
T_A = –40°C to +125°C
T_A = –40°C to +125°C, V_S = +1.8 V to +5.5 V
20
0.05
1
See ⁽¹⁾
±90
±100
10
Channel separation, dc
5
INPUT BIAS CURRENT
±275
I_B
Input bias current
I_OS
Input offset current
OPA4317
T_A = –40°C to +125°C
OPA4317
±155
±300
±400
±140
NOISE
e_n
Input voltage noise density
f = 1 kHz
55
f = 0.01 Hz to 1 Hz
0.3
Input voltage noise
f = 0.1 Hz to 10 Hz
1.1
i_n
Input current noise
f = 10 Hz
100
INPUT VOLTAGE RANGE
V_CM
Common-mode voltage range
CMRR
Common-mode rejection ratio
INPUT CAPACITANCE
T_A = –40°C to +125°C
(V–) – 0.1 V < V_CM < (V+) + 0.1 V
OPA4317, T_A = –40°C to +125°C
(V–) – 0.1 V < V_CM < (V+) + 0.1 V, V_S = 5.5 V
(V–) – 0.1
95
95
(V+) + 0.1
108
108
Differential
2
Common-mode
4
OPEN-LOOP GAIN
A_OL
Open-loop voltage gain
FREQUENCY RESPONSE
T_A = –40°C to +125°C, (V–) + 100 mV < V_O <
(V+) – 100 mV, R_L = 10 kΩ
100
110
GBW
Gain-bandwidth product
C_L = 100 pF
300
SR
Slew rate
G = +1
0.15
OUTPUT
Voltage output swing from rail
I_SC
Short-circuit current
C_L
Capacitive load drive
Open-loop output impedance
POWER SUPPLY
T_A = –40°C to +125°C
f = 350 kHz, I_O = 0
30
100
±5
See Typical Characteristics
2
V_S
Specified voltage range
I_Q
Quiescent current per amplifier
Turn-on time
TEMPERATURE
T_A = –40°C to +125°C, I_O = 0
V_S = +5 V
1.8
5.5
21
35
100
Specified range
–40
+125
Operating range
–40
+150
Storage range
–65
+150
UNIT
μV
μV
μV/°C
μV/V
μV/V
pA
pA
pA
pA
pA
nV/√Hz
μV_PP
μV_PP
fA/√Hz
V
dB
dB
pF
pF
dB
kHz
V/μs
mV
mA
kΩ
V
μA
μs
°C
°C
°C
(1) 300-hour life test at +150°C demonstrated randomly distributed variation of approximately 1 μV.
4
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