OPA4317 Datasheet, PDF (2/30 Pages) Texas Instruments – Low-Offset, Rail-to-Rail I/O Operational Amplifier

OPA317
OPA2317
OPA4317
SBOS682A – MAY 2013 – REVISED JUNE 2013
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE AND ORDERING INFORMATION⁽¹⁾
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Over operating free-air temperature range, unless otherwise noted.
Supply voltage, V_S = (V+) – (V–)
Signal input terminals, voltage⁽²⁾
Signal input terminals, current⁽²⁾
Output short-circuit⁽³⁾
Operating temperature
Storage temperature
Junction temperature
Electrostatic
discharge (ESD)
ratings:
Human body model (HBM)
Charged device model (CDM)
Machine model (MM)
VALUE
+7
(V–) –0.3 to (V+) + 0.3
±10
Continuous
–40 to +150
–65 to +150
+150
4000
1000
400
UNIT
V
V
mA
°C
°C
°C
V
V
V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
(2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.3 V beyond the supply rails should
be current limited to 10 mA or less.
(3) Short-circuit to ground, one amplifier per package.
2
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Product Folder Links: OPA317 OPA2317 OPA4317