BQ4017_14 Datasheet, PDF (4/14 Pages) Texas Instruments – 2048Kx8 Nonvolatile SRAM

Not Recommended for new Designs
bq4017/bq4017Y
Capacitance (TA = 25°C, F = 1MHz, VCC = 5.0V)
Symbol
CI/O
CIN
Parameter
Input/output capacitance
Input capacitance
Minimum
-
-
Typical
-
-
Maximum
40
40
Unit
pF
pF
Conditions
Output voltage = 0V
Input voltage = 0V
Note:
These parameters are sampled and not 100% tested.
AC Test Conditions
Parameter
Input pulse levels
Input rise and fall times
Input and output timing reference levels
Output load (including scope and jig)
Test Conditions
0V to 3.0V
5 ns
1.5 V (unless otherwise specified)
See Figures 1 and 2
Figure 1. Output Load A
Figure 2. Output Load B
Read Cycle (TA = 0 to 70°C, VCCmin ≤ VCC ≤ VCCmax)
Symbol
Parameter
tRC
tAA
tACE
tOE
tCLZ
tOLZ
tCHZ
tOHZ
tOH
Read cycle time
Address access time
Chip enable access time
Output enable to output valid
Chip enable to output in low Z
Output enable to output in low Z
Chip disable to output in high Z
Output disable to output in high Z
Output hold from address change
-70
Min.
Max.
70
-
-
70
-
70
-
35
5
-
5
-
0
25
0
25
10
-
Unit
Conditions
ns
ns Output load A
ns Output load A
ns Output load A
ns Output load B
ns Output load B
ns Output load B
ns Output load B
ns Output load A
4