THS1215_15 Datasheet, PDF (3/22 Pages) Texas Instruments – 3.3-V, 12-BIT, 15 MSPS, LOW-POWER ANALOG-TO-DIGITAL

www.ti.com
TERMINAL
NAME
NO.
AGND
1, 7
AV_DD
AIN+
8, 27
5
AIN-
6
CLK
28
CON1
2
CON0
3
DGND
19
DV_DD
20
D11
12
D10
13
D9
14
D8
15
D7
16
D6
17
D5
18
D4
21
D3
22
D2
23
D1
24
D0
25
EXTREF
4
OVRNG
11
OE
26
REFT
9
REFB
10
Not Recommended For New Designs
THS1215
TERMINAL FUNCTIONS
SLAS292A – MARCH 2001 – REVISED MARCH 2004
I/O
DESCRIPTION
I Analog ground
I Analog supply
I Positive analog input
I Negative analog input
I ADC conversion clock
I Configuration input 1
I Configuration input 0
I Digital ground
I Digital supply
O ADC data bit 11
O ADC data bit 10
O ADC data bit 9
O ADC data bit 8
O ADC data bit 7
O ADC data bit 6
O ADC data bit 5
O ADC data bit 4
O ADC data bit 3
O ADC data bit 2
O ADC data bit 1
O ADC data bit 0
I Reference select input (high = external, low = internal)
O Out of range indicator (high = out of range)
I Output enable (high = disable, low = enable)
I/O Upper ADC reference voltage
I/O Lower ADC reference voltage
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
over operating free-air temperature range (unless otherwise noted)
Supply voltage range
AV_DD to AGND, DV_DD to DGND
AGND to DGND
Reference voltage input range, REFT, REFB to AGND
Analog input voltage range, AIN+, AIN– to AGND
Clock input voltage range, CLK to AGND
Digital input voltage range, digital input to DGND
Digital output voltage range, digital output to DGND
Operating junction temperature range, T_J
Storage temperature range, T_STG
Lead temperature 1,6 mm (1/16 in) from case for 10 seconds
UNIT
–0.3 V to 4 V
–0.3 V to 0.3 V
–0.3 to AV_DD + 0.3 V
–0.3 to AV_DD + 0.3 V
–0.3 to AV_DD + 0.3 V
–0.3 to DV_DD + 0.3 V
–0.3 to DV_DD + 0.3 V
–40°C to 150°C
–65°C to 150°C
300°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
3