DAC8562 Datasheet, PDF (3/56 Pages) Analog Devices – +5 Volt, Parallel Input Complete 12-Bit DAC

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DAC8562, DAC8563
DAC8162, DAC8163
DAC7562, DAC7563
SLAS719C – AUGUST 2010 – REVISED JUNE 2011
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Over operating free-air temperature range (unless otherwise noted).
VALUE
UNIT
AV_DD to GND
CLR, D_IN, LDAC, SCLK and SYNC input voltage to GND
V_OUT to GND
V_REFIN/V_REFOUT to GND
Operating temperature range
–0.3 to 6
V
–0.3 to AV_DD + 0.3
V
–0.3 to AV_DD + 0.3
V
–0.3 to AV_DD + 0.3
V
–40 to 125
°C
Junction temperature, maximum (T_{J max})
150
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
THERMAL INFORMATION
DAC856x, DAC816x, DAC756x
THERMAL METRIC
DSC
DGS
UNIT
θ_JA
θ_JCtop
θ_JB
ψ_JT
ψ_JB
θ_JCbot
Junction-to-ambient thermal resistance⁽¹⁾
Junction-to-case (top) thermal resistance⁽²⁾
Junction-to-board thermal resistance⁽³⁾
Junction-to-top characterization parameter⁽⁴⁾
Junction-to-board characterization parameter⁽⁵⁾
Junction-to-case (bottom) thermal resistance⁽⁶⁾
10 PINS
62.8
44.3
26.5
0.4
25.5
46.2
10 PINS
173.8
48.5
79.9
1.7
68.4
N/A
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
(1) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(2) The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific
JEDEC-standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(3) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(4) The junction-to-top characterization parameter, ψ_JT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining θ_JA, using a procedure described in JESD51-2a (sections 6 and 7).
(5) The junction-to-board characterization parameter, ψ_JB, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining θ_JA , using a procedure described in JESD51-2a (sections 6 and 7).
(6) The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
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