TLC5943_17 Datasheet, PDF (2/40 Pages) Texas Instruments – 16-Channel, 16-Bit PWM LED Driver with 7-Bit Global Brightness Control

TLC5943
SBVS101 – DECEMBER 2007
www.ti.com
DESCRIPTION, CONTINUED
The TLC5943 has two error detection circuits for LED open detection (LOD) and a thermal error flag (TEF). LOD
detects a broken or disconnected LED and shorted LED to GND during the display period. TEF indicates an
over-temperature condition; when a TEF is set, all output drivers are turned off. When the TEF is cleared, all
output drivers are restarted.
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION⁽¹⁾
PRODUCT
TLC5943
TLC5943
PACKAGE-LEAD
HTSSOP-28 PowerPAD™
5 mm × 5 mm QFN-32
ORDERING NUMBER
TLC5943PWPR
TLC5943PWP
TLC5943RHBR
TLC5943RHBT
TRANSPORT MEDIA,
QUANTITY
Tape and Reel, 2000
Tube, 50
Tape and Reel, 3000
Tape and Reel, 250
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾⁽²⁾
Over operating free-air temperature range, unless otherwise noted.
V_CC
I_OUT
V_IN
V_OUT
T_J(max)
T_STG
PARAMETER
Supply voltage, V_CC
Output current (dc): OUT0 to OUT15
Input voltage range:
SIN, SCLK, XLAT, BLANK, GSCLK, BCSEL, IREF
Output voltage range
SOUT, XERR
OUT0 to OUT15
Maximum operating junction temperature
Storage temperature range
ESD rating
Human body model (HBM)
Charged device model (CDM)
TLC5943
–0.3 to +6.0
60
–0.3 to V_CC + 0.3
–0.3 to V_CC + 0.3
–0.3 to +18
+150
–55 to +150
2
500
UNIT
V
mA
V
V
V
°C
°C
kV
V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
(2) All voltage values are with respect to network ground terminal.
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