BQ2084DBTR-V150 Datasheet, PDF (2/69 Pages) Texas Instruments – SBS v1.1-COMPLIANT GAS GAUGE WITH LED DELAY

bq2084-V150
SLUS758 – JUNE 2007
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
DESCRIPTION (CONTINUED)
The bq2084-V150 contains 1k bytes of internal data flash memory, which store configuration information. The
information includes nominal capacity and voltage, self-discharge rate, rate compensation factors, and other
programmable cell-modeling factors used to accurately adjust remaining capacity for use-conditions based on
time, rate, and temperature. The bq2084-V150 also automatically calibrates or learns the true battery capacity in
the course of a discharge cycle from programmable near full to near empty levels.
The bq29312A analog front-end (AFE) protection IC is used to maximize functionality and safety and minimize
component count and cost in smart battery circuits. The bq29312A AFE protection IC provides power to the
bq2084-V150 from a 2-, 3-, or 4-series Li-ion cell stack, eliminating the need for an external regulator circuit.
T_A
–20°C to 85°C
ORDERING INFORMATION
PACKAGE ⁽¹⁾
38-PIN TSSOP (DBT)⁽²⁾
bq2084DBT-V150
(1) For the most current package and ordering information, see the Package Option Addendum at the end
of this document, or see the TI Web site at www.ti.com.
(2) The bq2084DBT-V150 is available in tape and reel. Add an R suffix to the device type (e.g.,
bq2084DBTR-V150) to order tape and reel version.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted⁽¹⁾
Supply voltage range, V_DD relative to V_SS ⁽²⁾
Open-drain I/O pins, V_(IOD) relative to V_SS(2)
Input voltage range to all other pins, V_I relative to V_Ss(2)
T_A
Operating free-air temperature range
T_stg Storage temperature range
UNIT
–0.3 V to 4.1 V
–0.3 V to 6 V
–0.3 V to V_DD + 0.3 V
–20°C to 85°C
–65°C to 150°C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) V_SS refers to the common node of V_(SSA), V_(SSD), and V_(SSP).
2
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