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AMC6821-Q1 Datasheet, PDF (2/54 Pages) Texas Instruments – INTELLIGENT TEMPERATURE MONITOR AND PWM FAN CONTROLLER
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AMC6821-Q1
SBAS475 – JUNE 2009 ...................................................................................................................................................................................................... www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
VDD GND
FAN-FAULT
THERM
OVR
Functional Block Diagram
Alarm
Detectors
AMC6821
SMBus
2
IC
Interface
SMBALERT
SDA
SCLK
A1
A0
Temperature
Data
IN+
MUX
IN-
ADC
(11-Bit)
On-Chip
Temperature Sensor
Ref
Remote
Temperature
Sensing
TACH-DATA
TACH COUNTER
TACH
PWM
Driver
PWM-Out
PWM-MODE
Auto Fan Speed
Controller
NOTE: Patents 7, 083,328 and 7,098,617
ABSOLUTE MAXIMUM RATINGS(1)
over operating free-air temperature range (unless otherwise noted)
VDD to GND
Digital input voltage to GND
Input current
Select pins A0, A1, PWM-MODE to GND
Analog input voltage to GND
Operating temperature range
Storage temperature range
Junction temperature (TJ Max)
–0.3 V to 6.5 V
–0.3 V to 6.5 V
10 mA
–0.3 V to VDD + 0.3 V
–0.3 V to VDD + 0.3 V
–40°C to 125°C
–65°C to 150°C
150°C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
RECOMMENDED OPERATING CONDITIONS
Operating VDD
Specified VDD
Operating temperature
MIN NOM MAX UNIT
2.7
5
5.5 V
3
5V
–40
125 °C
2
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