OPA189 Datasheet, PDF (15/34 Pages) Texas Instruments – Precision, 36-V, 14-MHz, MUX-Friendly Low-Noise, Rail-to-Rail Output, Zero-Drift Operational Amplifiers

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Feature Description (continued)
120
100
80
60
40
20
0
10M
100M
1G
Frequency (Hz)
Figure 5. EMIRR Testing
OPA189, OPA2189, OPA4189
SBOS830 – JUNE 2017
10G
C005
FREQUENCY
400 MHz
900 MHz
1.8 GHz
2.4 GHz
3.6 GHz
5 GHz
Table 2. OPAx189 EMIRR IN+ for Frequencies of Interest
APPLICATION AND ALLOCATION
Mobile radio, mobile satellite, space operation, weather, radar, ultra-high frequency
(UHF) applications
Global system for mobile communications (GSM) applications, radio
communication, navigation, GPS (to 1.6 GHz), GSM, aeronautical mobile, UHF
applications
GSM applications, mobile personal communications, broadband, satellite, L-band
(1 GHz to 2 GHz)
802.11b, 802.11g, 802.11n, Bluetooth^®, mobile personal communications,
industrial, scientific and medical (ISM) radio band, amateur radio and satellite, S-
band (2 GHz to 4 GHz)
Radiolocation, aero communication and navigation, satellite, mobile, S-band
802.11a, 802.11n, aero communication and navigation, mobile communication,
space and satellite operation, C-band (4 GHz to 8 GHz)
EMIRR IN+
48.4 dB
52.8 dB
69.1 dB
88.9 dB
82.5 dB
95.5 dB
8.3.5 EMIRR +IN Test Configuration
Figure 6 shows the circuit configuration for testing the EMIRR IN+. An RF source is connected to the op amp
noninverting input terminal using a transmission line. The op amp is configured in a unity-gain buffer topology
with the output connected to a low-pass filter (LPF) and a digital multimeter (DMM). A large impedance mismatch
at the op amp input causes a voltage reflection; however, this effect is characterized and accounted for when
determining the EMIRR IN+. The multimeter samples and measures the resulting DC offset voltage. The LPF
isolates the multimeter from residual RF signals that may interfere with multimeter accuracy.
Ambient temperature: 25Û&
RF source
DC Bias: 0 V
Modulation: None (CW)
Frequency Sweep: 201 pt. Log
+VS
±
50
+
-VS
Not shown: 0.1 µF and 10 µF
supply decoupling
Low-Pass Filter
Sample /
Averaging
Digital Multimeter
Figure 6. EMIRR +IN Test Configuration
Copyright © 2017, Texas Instruments Incorporated
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