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LP3923_15 Datasheet, PDF (13/37 Pages) Texas Instruments – Cellular Phone Power Management Unit
LP3923
www.ti.com
SNVS567B – APRIL 2010 – REVISED MAY 2013
Charger Electrical Characteristics (continued)
Unless otherwise noted, VCHG_IN = 5V, VIN= BATT = 3.6V, CCHG_IN = 1 μF, VBATT = 30 µF. Typical values and limits appearing
in normal type apply for TJ = 25°C. Limits appearing in boldface type apply over the entire junction temperature range for
operation, TA = TJ = −25°C to +85°C.(1)(2)
Symbol
Parameter
Conditions
Typical
Limit
Units
Min
Max
IEOC
End-of-charging
0.1C option selected
current, % of full-rate
current
10
%
VRESTART
Restart threshold voltage From VTERM voltage (4.2V, −100 mV options
selected)
−100
−70
−130
mV
IMON
CBATT
TREG
IMON Voltage 1
IMON Voltage 2
Capacitance on BATT
Regulated junction
temperature
ICHG = 100 mA
ICHG = 400 mA
See (4)
See (4)
0.247
V
0.988
0.840 1.127
30
1000
µF
115
°C
Detection and Timing (one combined timer)
TPOK
Power OK deglitch time VCHG > VBATT + VOK_CHG
30
ms
TPC_FULL
Deglitch time
From pre-charging to full-rate charging
210
ms
TCHG
Charge timer
Pre-charge mode
1
disabled
2
Hrs
CC mode/CV mode (combined timer)
5
8
TEOC
Deglitch time for end- of-
charge transition
210
ms
(4) Ensured by design.
Serial Interface
Unless otherwise noted, VIN = BATT = 3.6V, GND = 0V, CVIN1–2 = 10 µF CLDOx = 1 µF and VLDO3 = 3.0V. Typical values and
limits appearing in normal type apply for TJ = 25°C. Limits appearing in boldface type apply over the entire junction
temperature range for operation, TA = TJ = −40°C to +125°C.(1)(2)
Symbol
Parameter
Conditions
Typ
Limit
Min Max
Unit
s
fCLK
tBF
tHOLD
tCLK-LP
tCLK-HP
tSU
tDATA-HOLD
tDATA-SU
tSU
tTRANS
Clock Frequency
Bus-Free Time between START and STOP
Hold Time Repeated START Condition
CLK Low Period
CLK High Period
Set-Up Time Repeated START Condition
Data Hold Time
Data Set-Up Time
Set-Up Time for STOP Condition
Maximum Pulse Width of Spikes that Must Be
Suppressed by the Input Filter of Both DATA & CLK
Signals
400 kHz
1.3
µs
0.6
µs
1.3
µs
0.6
µs
0.6
µs
50
ns
100
ns
0.6
µs
50
ns
(1) All limits are specified. All electrical characteristics having room-temperature limits are tested during production with TJ = 25°C. All hot
and cold limits are ensured by correlating the electrical characteristics to process and temperature variations and applying statistical
process control.
(2) Ensured by design.
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