DAC38RF80_017 Datasheet, PDF (13/155 Pages) Texas Instruments – Dual- or Single-Channel, Single-Ended or Differential Output, 14-Bit, 9-GSPS, RF-Sampling DAC With JESD204B Interface and On-Chip PLL

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DAC38RF80, DAC38RF83, DAC38RF84
DAC38RF85, DAC38RF90, DAC38RF93
SLASEA3C – DECEMBER 2016 – REVISED JULY 2017
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)⁽¹⁾
Supply Voltage Range⁽²⁾
Voltage between AGND and DGND
Pin Voltage Range⁽²⁾
Peak input current (any input)
Peak total input current (all inputs)
Junction temperature T_J
Operating free-air temperature, T_A
Storage temperature, T_stg
VDDDAC1, VDDDIG1, VDDL1_1, VDDL2_1,
VDDCLK1, VDDT1, VDDCLK1, VDDTX1, VDDE1
VDDR18, VDDIO18, VDDS18, VDDAPLL18,
VDDOUT18, VDDA18, VDDAVCO18, VDDTX18
VEE18N
RX[0..7]+/-
SDEN, SCLK, SDIO, SDO, TXENABLE, ALARM,
RESET, SLEEP, TMS, TCLK, TDI, TDO, TRST,
TESTMODE, GPI0, GPI1, GPO0, GPO1
CLKOUT+/-
DACCLK+/-, SYSREF+/-, DACCLKSE
SYNC0+/-, SYNC1+/-
VOUT1+/-, VOUT2+/-
RBIAS, EXTIO, ATEST
IFORCE, VSENSE
AMUX1, AMUX0
MIN
MAX
UNIT
–0.3
1.3
V
–0.3
2.45
V
–2
0.3
V
–0.3
0.3
V
–0.5
VDDDIG1 + 0.5 V
V
–0.5
VDDIO + 0.5 V
V
–0.5
VDDTX18 + 0.5 V
V
–0.5
VDDCLK1 + 0.5 V
V
–0.5
VDDS18 + 0.5 V
V
–0.5
VDDAOUT18 + 0.5 V
V
–0.5
VDDAOUT18 + 0.5 V
V
–0.5
VDDDIG1 + 0.5 V
V
–0.5
VDDT1 + 0.5 V
V
20
mA
–30
mA
150
°C
–40
85
°C
–65
150
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Measured with respect to AGND or DGND.
7.2 ESD Ratings
V_(ESD) Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001⁽¹⁾
Charged-device model (CDM), per JEDEC specification JESD22-
C101 ⁽²⁾
VALUE
±1000
±250
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
UNIT
V
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
Recommended operating temperature
T_J
Maximum rated operating junction temperature⁽¹⁾
T_A
Recommended free-air temperature
VDDA18, VDDAPLL18, VDDS18, VDDIO18, VDDR18,
VDDAPLL18, VDDOUT18, VDDAVCO18
Supply Voltage Range
VDDDIG1 VDDA1, VDDT1, VDDAPLL1, VDDCLK1, VDDL1_1,
VDDL2_1, VDDTX1, VDDE1
VEE18N
(1) Prolonged use at this junction temperature may increase the device failure-in-time (FIT) rate
MIN
125
–40
1.71
0.95
-1.89
NOM
1.8
1
-1.8
MAX
105
85
1.89
UNIT
°C
°C
°C
V
1.05
V
-1.71
V
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