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DAC3484_15 Datasheet, PDF (12/107 Pages) Texas Instruments – DAC3484 Quad-Channel, 16-Bit, 1.25 GSPS Digital-to-Analog Converter (DAC)
DAC3484
SLAS749E – MARCH 2011 – REVISED NOVEMBER 2015
www.ti.com
6.4 Thermal Information
DAC3484
THERMAL METRIC(1)
RKD
(WQFN-MR)
ZAY
(NFBGA)
UNIT
88 PINS
196 BALLS
RθJA
RθJCtop
RθJCbot
θJB
ψJT
ψJB
Junction-to-ambient thermal resistance
Junction-to-case (top) thermal resistance
Junction-to-case (bottom) thermal resistance
Junction-to-board thermal resistance
Junction-to-top characterization parameter
Junction-to-board characterization parameter
22.1
37.6
°C/W
7.1
6.8
°C/W
0.6
N/A
°C/W
4.7
16.8
°C/W
0.1
0.2
°C/W
4.6
16.4
°C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report (SPRA953).
6.5 Electrical Characteristics – DC Specifications(1)
over recommended operating free-air temperature range, nominal supplies, IOUTFS = 20 mA (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
Resolution
16
Bits
DC ACCURACY
DNL
INL
Differential nonlinearity
Integral nonlinearity
1 LSB = IOUTFS/216
±2
LSB
±4
LSB
ANALOG OUTPUT
Coarse gain linearity
±0.04
LSB
Offset error
Mid code offset
±0.001
%FSR
Gain error
With external reference
With internal reference
±2
%FSR
±2
%FSR
Gain mismatch
With internal reference
±2
%FSR
Full scale output current
10
20 30 mA
Output compliance range
–0.5
0.6 V
Output resistance
300
kΩ
Output capacitance
5
pF
REFERENCE OUTPUT
VREF
Reference output voltage
Reference output current(2)
1.2
V
100
nA
REFERENCE INPUT
VEXTIO
Input voltage range
Input resistance
External Reference Mode
0.6
1.2 1.25 V
1
MΩ
Small signal bandwidth
472
kHz
Input capacitance
100
pF
TEMPERATURE COEFFICIENTS
Offset drift
±1
ppm/°C
Gain drift
with external reference
with internal reference
±15
ppm/°C
±30
ppm/°C
Reference voltage drift
±8
ppm/°C
(1) Measured differentially across IOUTP/N with 25 Ω each to GND.
(2) Use an external buffer amplifier with high impedance input to drive any external load.
12
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