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TMS470R1A288PGEA Datasheet, PDF (1/62 Pages) Texas Instruments – 16/32-Bit RISC Flash Microcontroller
www.ti.com
FEATURES
• High-Performance Static CMOS Technology
• TMS470R1x 16/32-Bit RISC Core
(ARM7TDMI™)
– 24-MHz System Clock (48-MHz Pipeline)
– Independent 16/32-Bit Instruction Set
– Open Architecture With Third-Party
Support
– Built-In Debug Module
• Integrated Memory
– 288K-Byte Program Flash
– Two Banks With 8 Contiguous Sectors
– 16K-Byte Static RAM (SRAM)
– Memory Security Module (MSM)
– JTAG Security Module
• Operating Features
– Low-Power Modes: STANDBY and HALT
– Extended Industrial Temperature Range
• 470+ System Module
– 32-Bit Address Space Decoding
– Bus Supervision for Memory/Peripherals
– Digital Watchdog (DWD) Timer
– Analog Watchdog (AWD) Timer
– Enhanced Real-Time Interrupt (RTI)
– Interrupt Expansion Module (IEM)
– System Integrity and Failure Detection
– ICE Breaker
• Direct Memory Access (DMA) Controller
– 32 Control Packets and 16 Channels
• Zero-Pin Phase-Locked Loop (ZPLL)-Based
Clock Module With Prescaler
– Multiply-by-8 Internal ZPLL Option
– ZPLL Bypass Mode
• High-End Timer Lite (HET)
– 12 Programmable I/O Channels:
– 12 High-Resolution Pins
– High-Resolution Share Feature (XOR)
– High-End Timer RAM
– 64-Instruction Capacity
• External Clock Prescale (ECP) Module
– Programmable Low-Frequency External
Clock (CLK)
• Ten Communication Interfaces:
TMS470R1A288
16/32-Bit RISC Flash Microcontroller
SPNS106B – SEPTEMBER 2005 – REVISED AUGUST 2006
– Two Serial Peripheral Interfaces (SPIs)
– 255 Programmable Baud Rates
– Two Serial Communication Interfaces
(SCIs)
– 224 Selectable Baud Rates
– Asynchronous/Isosynchronous Modes
– Class II Serial Interface B (C2SIb)
– Normal 10.4 Kbps and 4X Mode 41.6
Kbps
– Two Standard CAN Controllers (SCC)
– 16-Mailbox Capacity
– Fully Compliant With CAN Protocol,
Version 2.0B
– Three Inter-Integrated Circuit (I2C) Modules
– Multi-Master and Slave Interfaces
– Up to 400 Kbps (Fast Mode)
– 7- and 10-Bit Address Capability
• 12-Channel 10-Bit Multi-Buffered ADC
(MibADC)
– 64-Word FIFO Buffer
– Single- or Continuous-Conversion Modes
– 1.55 µs Minimum Sample/Conversion Time
– Calibration Mode and Self-Test Features
• Flexible Interrupt Handling
• Expansion Bus Module (EBM) (PGE only)
– Supports 8- and 16-Bit Expansion Bus
Memory Interface Mappings
– 42 I/O Expansion Bus Pins
• 50 Dedicated General-Purpose I/O (GIO) Pins
and 43 Additional Peripheral I/Os (PGE)
• 14 Dedicated General-Purpose I/O (GIO) Pins
and 43 Additional Peripheral I/Os (PZ)
• 16 External Interrupts
• On-Chip Scan-Base Emulation Logic, IEEE
Standard 1149.1(1) (JTAG) Test-Access Port
• 144-Pin Plastic Low-Profile Quad Flatpack
(PGE Suffix)
• 100-Pin Plastic Low-Profile Quad Flatpack (PZ
Suffix)
(1) The test-access port is compatible with the IEEE Standard
1149.1-1990, IEEE Standard Test-Access Port and Boundary
Scan Architecture specification. Boundary scan is not
supported on this device.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
ARM7TDMI is a trademark of Advanced RISC Machines Limited (ARM).
All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2006, Texas Instruments Incorporated