ADS61JB46 Datasheet, PDF (1/48 Pages) Texas Instruments – 14-Bit, Input-Buffered, 160-MSPS, Analog-to-Digital Converter with JESD204A Output Interface

ADS61JB46
www.ti.com
SBAS611B – SEPTEMBER 2013 – REVISED OCTOBER 2013
14-Bit, Input-Buffered, 160-MSPS, Analog-to-Digital Converter
with JESD204A Output Interface
Check for Samples: ADS61JB46
FEATURES
1
•2 Output Interface:
– Single-Lane and Dual-Lane Interfaces
– Maximum Data Rate: 3.125 Gbps
– Meets JEDEC JESD204A Specification
– CML Outputs with Current Programmable
from 2 mA to 32 mA
• Power Dissipation:
– 583 mW at 160 MSPS in Dual-Lane Mode
– Power Scales Down with Clock Rate
• Input Interface: Buffered Analog Inputs
• SNR at 185-MHz IF: –72.7 dBFS
• Analog Input Dynamic Range: 2 V_PP
• Reference Support:
External and Internal (Trimmed)
• Supply:
– Analog and Digital: 1.8 V
– Input Buffer: 3.3 V
• Programmable Digital Gain: 0 dB to 6 dB
• Output: Straight Offset Binary or
Twos Complement
• Package: 6-mm × 6-mm QFN-40
APPLICATIONS
• Wireless Base-Station Infrastructures
• Test and Measurement Instrumentation
DESCRIPTION
The ADS61JB46 is a high-performance, low-power,
single-channel, analog-to-digital converter with an
integrated JESD204A output interface. Available in a
6-mm × 6-mm QFN package, with both single-lane
and dual-lane output modes, the device offers an
unprecedented level of compactness. The output
interface is compatible to the JESD204A standard,
with an additional mode (as per the IEEE standard
802.3-2002 part 3, clause 36.2.4.12) to interface
seamlessly to the TI TLK family of SERDES
transceivers. Equally impressive is the inclusion of an
on-chip analog input buffer, providing isolation
between the sample-and-hold switches and higher
and more consistent input impedance.
The device is specified over the industrial
temperature range (–40°C to +85°C).
1
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated