CC2545_15 Datasheet, PDF (8/31 Pages) Texas Instruments – System-on-Chip for 2.4-GHz RF Applications

CC2545
SWRS106B – JUNE 2012 – REVISED FEBRUARY 2013
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ANALOG TEMPERATURE SENSOR
Measured on Texas Instruments CC2545EM reference design with T_A = 25°C, VDD = 3.0 V unless otherwise noted
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Output
1480
12-bit
Temperature coefficient
4.5
/ 0.1ºC
Voltage coefficient
Measured using integrated ADC, internal band-gap
1
Initial accuracy without calibration
voltage reference, and maximum resolution
±10
/ 0.1V
ºC
Accuracy using 1-point calibration
±5
ºC
Current consumption when enabled
0.5
mA
COMPARATOR CHARACTERISTICS
T_A = 25°C, VDD = 3 V. All measurement results are obtained using the CC2545 reference designs, post-calibration.
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
Common-mode maximum voltage
VDD
V
Common-mode minimum voltage
–0.3
Input offset voltage
1
mV
Offset vs temperature
16
µV/°C
Offset vs operating voltage
4
mV/V
Supply current
230
nA
Hysteresis
0.15
mV
8
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