CC2545_15 Datasheet, PDF (7/31 Pages) Texas Instruments – System-on-Chip for 2.4-GHz RF Applications

CC2545
www.ti.com
SWRS106B – JUNE 2012 – REVISED FEBRUARY 2013
32-kHz RC OSCILLATOR
Measured on Texas Instruments CC2545EM reference design with T_A = 25°C, VDD = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Calibrated frequency
32.753
kHz
Frequency accuracy after calibration
±0.2%
Temperature coefficient
0.4
%/ºC
Supply-voltage coefficient
3
%/V
Calibration time
2
ms
16-MHz RC OSCILLATOR
Measured on Texas Instruments CC2545EM reference design with T_A = 25°C, VDD = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Calibrated frequency
16
MHz
Uncalibrated frequency accuracy
±18%
Frequency accuracy after calibration
±0.6%
Start-up time
10
µs
Initial calibration time
50
µs
RSSI CHARACTERISTICS
Measured on Texas Instruments CC2545EM reference design with T_A = 25°C, VDD = 3 V, unless otherwise noted.
2Mbps, GFSK, 320-kHz Deviation, 0.1% BER and 2 Mbps, GFSK, 500-kHz Deviation, 0.1% BER
RSSI range⁽¹⁾
Reduced gain by AC algorithm
64
High gain by AGC algorithm
64
RSSI offset⁽¹⁾
Absolute uncalibrated accuracy⁽¹⁾
Reduced gain by AGC algorithm
79
High gain by AGC algorithm
99
±3
Step size (LSB value)
1
All Other Rates/Formats
RSSI range⁽¹⁾
64
RSSI offset⁽¹⁾
99
Absolute uncalibrated accuracy
±3
Step size (LSB value)
1
(1) Assuming CC2545 EM reference design. Other RF designs give an offset from the reported value.
dB
dBm
dB
dB
dB
dBm
dB
dB
FREQUENCY SYNTHESIZER CHARACTERISTICS
Measured on Texas Instruments CC2545EM reference design with T_A = 25°C, VDD = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
At ±1 MHz from carrier
–112
Phase noise, unmodulated carrier At ±3 MHz from carrier
–119
dBc/Hz
At ±5 MHz from carrier
–122
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