BQ3060 Datasheet, PDF (6/17 Pages) Texas Instruments – SBS 1.1-COMPLIANT GAS GAUGE and PROTECTION with CEDV

bq3060
SLUS928A – MARCH 2009 – REVISED NOVEMBER 2009
INTERNAL LDO
PARAMETER
V_REG
ΔV_(REGTEMP)
Regulator output voltage
Regulator output change
with temperature
ΔV_(REGLINE)
ΔV_(REGLOAD)
I_(REGMAX)
Line regulation
Load regulation
Current limit
TEST CONDITIONS
I_REG27 = 10 mA
T_A = –40°C to 85°C
I_REG = 10 mA
T_A = –40°C to 85°C
I_REG = 10 mA
I_REG = 0.2 to 10 mA
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MIN
TYP MAX UNIT
2.5
2.7 2.75 V
±0.5%
±2
±4 mV
±20 ±40 mV
25
50 mA
SRx WAKE FROM SLEEP
PARAMETER
V_{WAKE_ACR}
Accuracy of V_WAKE
V_{WAKE_TCO}
t_WAKE
Temperature drift of VWAKE accuracy
Time from application of current and wake of bq3060
TEST CONDITION
V_WAKE = 1.2 mV
V_WAKE = 2.4 mV
V_WAKE = 5 mV
V_WAKE = 10 mV
MIN TYP
0.2 1.2
0.4 2.4
2
5
5.3
10
0.5
0.2
MAX
2
3.6
6.8
13
1
UNIT
mV
%/°C
ms
COULOMB COUNTER
PARAMETER
Input voltage range
Conversion time
Effective resolution
Integral nonlinearity
Offset error ⁽¹⁾
Offset error drift
Full-scale error⁽²⁾
Full-scale error drift
Effective input resistance
TEST CONDITION
Single conversion
Single conversion
T_A = –25°C to 85°C
T_A = –25°C to 85°C
(1) Post Calibration Performance
(2) Uncalibrated performance. This gain error can be eliminated with external calibration.
ADC
PARAMETER
Input voltage range
Conversion time
Resolution (no missing codes)
Effective resolution
Integral nonlinearity
Offset error ⁽¹⁾
Offset error drift
Full-scale error
Full –scale error drift
Effective input resistance
(1) Channel to channel offset
V_IN = 1 V
TEST CONDITION
MIN
-0.20
15
–0.8%
2.5
TYP
250
±0.007
10
0.3
0.2%
MAX
0.25
±0.034
0.5
0.8%
150
UNIT
V
ms
Bits
%FSR
μV
μV/°C
PPM/°C
MΩ
MIN TYP
–0.2
31.5
16
14
15
–0.8%
70
1
±0.2%
8
MAX
0.8×V_REG27
±0.020
160
0.4%
150
UNIT
V
ms
Bits
Bits
%FSR
μV
μV/°C
PPM/°C
MΩ
6
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