LP2989LV_15 Datasheet, PDF (5/26 Pages) Texas Instruments – Micropower and Low-Noise, 500-mA Ultra Low-Dropout Regulator for Use With Ceramic Output Capacitors

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LP2989LV
SNVS086K – MAY 2000 – REVISED JULY 2015
6.5 Electrical Characteristics
Unless otherwise specified: T_J = 25°C, V_IN = V_OUT(NOM) + 1 V, I_OUT = 1 mA, C_OUT = 4.7 µF, C_IN = 2.2 µF, V_SD = 2 V.
PARAMETER
TEST CONDITIONS
LP2989LVAI-X.X ⁽¹⁾
MIN TYP MAX
LP2989LVI-X.X ⁽¹⁾
MIN TYP MAX
UNIT
−0.75
0.75 −1.25
1.25
1 mA < I_OUT < 500 mA,
V_OUT(NOM) + 1 V ≤ V_IN ≤ 16
−1.5
1.5 −2.5
2.5
V
V_OUT
Output voltage tolerance
ΔV_OUT/ΔV_IN
Output voltage line
regulation
ΔV_OUT/ΔI_OUT Load regulation
V_IN
(minimum)
Minimum input voltage
required to maintain
output regulation
1 mA < I_OUT < 500 mA,
V_OUT(NOM) + 1 V ≤ V_IN ≤ 16
V, –40°C ≤ T_J ≤ 125°C
1 mA < I_OUT < 500 mA,
V_OUT(NOM) + 1 V ≤ V_IN ≤ 16
V, −25°C ≤ T_J ≤ 125°C
V_OUT(NOM) + 1 V ≤ V_IN ≤ 16
V
V_OUT(NOM) + 1 V ≤ V_IN ≤ 16
V, –40°C ≤ T_J ≤ 125°C
1 mA < I_OUT < 500 mA
V_OUT = 1.8 V
I_OUT = 100 µA
V_OUT = 1.8 V
I_OUT = 250 µA
V_OUT = 1.8 V
I_OUT = 500 µA
I_OUT = 100 µA
I_OUT = 100 µA, –40°C ≤ T_J ≤
125°C
−4
2.5
−5
3.5 ^%VNOM
−3.5
2.5 −4.5
3.5
0.005 0.014
0.005
0.4
1.96
0.032
1.98
2.11
110
175
110
200
0.005
0.005
0.4
1.96
0.014
%/V
0.032
%V_NOM
1.98
V
2.11
110
175
µA
110
200
I_GND
Ground pin current
I_OUT= 200 mA
I_OUT = 200 mA, –40°C ≤ T_J
≤ 125°C
I_OUT = 500 mA
I_OUT = 500 mA, –40°C ≤ T_J
≤ 125°C
1
2
1
3.5
3
6
3
9
1
2
mA
1
3.5
3
6
mA
3
9
I_OUT(PK)
I_OUT(MAX)
e_n
Peak output current
Short circuit current
Output noise voltage
(RMS)
ΔV_OUT/ΔV_IN
ΔV_OUT/ΔT_D
Ripple Rejection
Output voltage
temperature coefficient
V_SD < 0.18 V, –40°C ≤ T_J ≤
125°C
V_SD < 0.4 V
V_OUT ≥ V_OUT(NOM) − 5%
R_L = 0 (Steady State)⁽²⁾
BW = 100 Hz to 100 kHz,
C_OUT = 10 µF, C_BYPASS =
.01 µF, V_OUT = 2.5 V
f = 1 kHz, C_OUT = 10 µF
See⁽³⁾, –40°C ≤ T_J ≤ 125°C
0.5
0.05
600
800
1000
18
60
20
2
0.5
0.8
0.05
600
800
1000
18
60
20
2
µA
0.8
mA
mA
µV_(RMS)
dB
ppm/°C
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using
Statistical Quality Control (SQC) methods. The limits are used to calculate TI’s Average Outgoing Quality Level (AOQL).
(2) See Typical Characteristics.
(3) Temperature coefficient is defined as the maximum (worst-case) change divided by the total temperature range.
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