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AMC1204-Q1_15 Datasheet, PDF (5/33 Pages) Texas Instruments – 20 MHz, Second-Order, Isolated Delta-Sigma Modulator for Current-Shunt Measurement
AMC1204-Q1
www.ti.com
SLAS886B – JULY 2012 – REVISED JANUARY 2013
ELECTRICAL CHARACTERISTICS
All minimum/maximum specifications at TA = –40°C to 125°C, AVDD = 4.5 V to 5.5 V, DVDD = 2.7 V to 5.5 V, VINP = –250
mV to 250 mV, VINN = 0 V, and sinc3 filter with OSR = 256, unless otherwise noted. Typical values are at TA = 25°C,
AVDD = 5 V, and DVDD = 3.3 V.
PARAMETER
TA
Specified ambient temperature range
RESOLUTION
Resolution
DC ACCURACY
INL
Integral linearity error(1)
DNL
VOS
TCVOS
GERR
TCGERR
PSRR
Differential nonlinearity(2)
Offset error(3)
Offset error thermal drift
Gain error(3)
Gain error thermal drift
Power-supply rejection ratio
ANALOG INPUTS
FSR
Full-scale differential voltage input range
Specified FSR
VCM
Operating common-mode signal(2)
CI
Input capacitance to AGND
CID
Differential input capacitance
RID
Differential input resistance
IIL
Input leakage current
CMTI
Common-mode transient immunity
CMRR
Common-mode rejection ratio
EXTERNAL CLOCK
tCLKIN
fCLKIN
Clock period
Input clock frequency
DutyCLKIN Duty cycle
AC ACCURACY
SINAD
Signal-to-noise + distortion
SNR
Signal-to-noise ratio
THD
Total harmonic distortion
SFDR
Spurious-free dynamic range
DIGITAL INPUTS(2)
IIN
Input current
CIN
Input capacitance
CMOS logic family
VIH
High-level input voltage
VIL
Low-level input voltage
TEST CONDITIONS
TA = –40°C to 85°C
TA = –40°C to 125°C
VINP – VINN
VINP or VINN
VINP – VINN = ±250 mV
VINP – VINN = ±320 mV
VIN from 0 V to 5 V at 0 Hz
VIN from 0 V to 5 V at 100 kHz
5 MHz ≤ fCLKIN < 20 MHz
20 MHz ≤ fCLKIN ≤ 22 MHz
fIN = 1 kHz, TA = –40°C to 105°C
fIN = 1 kHz, TA = –40°C to 125°C
fIN = 1 kHz, TA = –40°C to 105°C
fIN = 1 kHz, TA = –40°C to 125°C
fIN = 1 kHz, TA = –40°C to 105°C
fIN = 1 kHz, TA = –40°C to 125°C
fIN = 1 kHz, TA = –40°C to 105°C
fIN = 1 kHz, TA = –40°C to 125°C
VIN = DVDD to DGND
DVDD = 4.5 V to 5.5 V
DVDD = 4.5 V to 5.5 V
AMC1204-Q1
MIN
TYP
–40
MAX
125
UNIT
°C
16
Bits
–8
±2
-16
±5
–1
–1
±0.1
–3.5
±1
–2.5
±0.5
±30
79
8
LSB
16
LSB
1
LSB
1
mV
3.5 μV/°C
2.5
%
ppm/°C
dB
–250
–160
–10
–50
15
±320
7
3.5
12.5
108
114
250
AVDD
10
50
mV
mV
mV
pF
pF
kΩ
μA
μA
kV/μs
dB
dB
45.5
50
5
20
40
50
45
50
200
ns
22
MHz
60
%
55
%
70
87
69
87
83
88
82
88
–96
–96
72
96
71
96
dB
dB
dB
dB
–70
dB
–69
dB
dB
dB
–10
10
μA
5
pF
CMOS with Schmitt-trigger
0.7 DVDD
DVDD + 0.3
V
–0.3
0.3 DVDD
V
(1) Integral nonlinearity is defined as the maximum deviation from a straight line passing through the end-points of the ideal ADC transfer
function expressed as number of LSBs or as a percent of the specified 500 mV input range.
(2) Ensured by design.
(3) Maximum values, including temperature drift, are ensured over the full specified temperature range.
Copyright © 2012–2013, Texas Instruments Incorporated
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