BQ4014_08 Datasheet, PDF (4/13 Pages) Texas Instruments – 256Kx8 Nonvolatile SRAM

bq4014/bq4014Y
AC Test Conditions
Parameter
Input pulse levels
Input rise and fall times
Input and output timing reference levels
Output load (including scope and jig)
Test Conditions
0V to 3.0V
5 ns
1.5 V (unless otherwise specified)
See Figures 1 and 2
Figure 1. Output Load A
Figure 2. Output Load B
Read Cycle (TA = 0 to 70°C, VCCmin ≤ VCC ≤ VCCmax)
Symbol
Parameter
tRC
Read cycle time
tAA
Address access time
tACE
Chip enable access time
tOE
Output enable to output valid
tCLZ
Chip enable to output in low Z
tOLZ
Output enable to output in low Z
tCHZ
Chip disable to output in high Z
tOHZ
Output disable to output in high Z
tOH
Output hold from address change
-85
-120
Min. Max. Min. Max.
85
- 120 -
-
85 - 120
-
85 - 120
-
45
- 60
5
-
5
-
0
-
0
-
0
35
0 45
0
25
0 35
10
-
10 -
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
Conditions
Output load A
Output load A
Output load A
Output load B
Output load B
Output load B
Output load B
Output load A
Sept. 1992
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