TMS320F28069 Datasheet, PDF (22/159 Pages) Texas Instruments – Piccolo Microcontrollers

TMS320F28069, TMS320F28068, TMS320F28067, TMS320F28066
TMS320F28065, TMS320F28064, TMS320F28063, TMS320F28062
SPRS698A – NOVEMBER 2010 – REVISED JANUARY 2011
www.ti.com
3.4 Signal Descriptions
Table 3-6 describes the signals. With the exception of the JTAG pins, the GPIO function is the default at
reset, unless otherwise mentioned. The peripheral signals that are listed under them are alternate
functions. Some peripheral functions may not be available in all devices. See Table 3-1 for details. Inputs
are not 5-V tolerant. All GPIO pins are I/O/Z and have an internal pullup, which can be selectively
enabled/disabled on a per-pin basis. This feature only applies to the GPIO pins. The pullups on the PWM
pins are not enabled at reset. The pullups on other GPIO pins are enabled upon reset. The AIO pins do
not have an internal pullup.
NOTE: When the on-chip VREG is used, the GPIO19, GPIO34, GPIO35, GPIO36, GPIO37, and GPIO38
pins could glitch during power up. If this is unacceptable in an application, 1.8 V could be supplied
externally. There is no power-sequencing requirement when using an external 1.8-V supply. However, if
the 3.3-V transistors in the level-shifting output buffers of the I/O pins are powered prior to the 1.9-V
transistors, it is possible for the output buffers to turn on, causing a glitch to occur on the pin during power
up. To avoid this behavior, power the V_DD pins prior to or simultaneously with the V_DDIO pins, ensuring that
the V_DD pins have reached 0.7 V before the V_DDIO pins reach 0.7 V.
Table 3-6. Terminal Functions⁽¹⁾
TERMINAL
NAME
PZ/PZP
PIN #
PN/PFP
PIN #
I/O/Z
DESCRIPTION
JTAG
TRST
TCK
TMS
TDI
TDO
12
10
See GPIO38
See GPIO36
See GPIO35
See GPIO37
JTAG test reset with internal pulldown. TRST, when driven high, gives the scan system
control of the operations of the device. If this signal is not connected or driven low, the
device operates in its functional mode, and the test reset signals are ignored.
NOTE: TRST is an active-high test pin and must be maintained low at all times during
I
normal device operation. An external pull-down resistor is required on this pin. The
value of this resistor should be based on drive strength of the debugger pods
applicable to the design. A 2.2-kΩ resistor generally offers adequate protection. Since
this is application-specific, it is recommended that each target board be validated for
proper operation of the debugger and the application. (↓)
I
See GPIO38. JTAG test clock with internal pullup. (↑)
I
See GPIO36. JTAG test-mode select (TMS) with internal pullup. This serial control
input is clocked into the TAP controller on the rising edge of TCK. (↑)
I
See GPIO35. JTAG test data input (TDI) with internal pullup. TDI is clocked into the
selected register (instruction or data) on a rising edge of TCK. (↑)
See GPIO37. JTAG scan out, test data output (TDO). The contents of the selected
O/Z register (instruction or data) are shifted out of TDO on the falling edge of TCK.
(8-mA drive)
FLASH
V_DD3VFL
TEST2
46
37
3.3-V Flash Core Power Pin. This pin should be connected to 3.3 V at all times.
45
36
I/O Test Pin. Reserved for TI. Must be left unconnected.
(1) I = Input, O = Output, Z = High Impedance, OD = Open Drain, ↑ = Pullup, ↓ = Pulldown
22
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TMS320F28064 TMS320F28063 TMS320F28062