DAC8541 Datasheet, PDF (2/21 Pages) Texas Instruments – 16-BIT SINGLE CHANNEL, PARALLEL INPUT DIGITAL-TO-ANALOG CONVERTER WITH RAIL VOLTAGE OUTPUT

DAC8541
SLAS353 − DECEMBER 2001
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
PRODUCT
DAC8541
PACKAGE
32-TQFP
AVAILABLE OPTIONS
PACKAGE
DRAWING NUMBER
TA
PACKAGE
MARKING
PBS
−40°C to 85°C
E41Y
ORDERING
NUMBER
DAC8541Y/250
DAC8541Y/2K
TRANSPORT
MEDIA
Tape and Reel
absolute maximum ratings over operating free-air temperature (unless otherwise noted)^†
AV_DD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to 6 V
DV_DD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to 6 V
Digital input voltage to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to DV_DD + 0.3 V
V_OUT to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to AV_DD + 0.3 V
Operating temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −40°C to 85°C
Storage temperature range, T_stg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to 150°C
Junction temperature, T_J max . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 150°C
† _{Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and}
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
electrical characteristics, DV_DD = 1.8 V to 5.5 V; AV_DD = 2.7 V to 5.5 V; R_L = 2 kΩ to AGND; C_L = 200
pF to AGND; all specifications –40°C to 85°C (unless otherwise noted)
PARAMETER
STATIC PERFORMANCE (see Note 1)
Resolution
Relative accuracy
Differential nonlinearity
Zero code error
Full-scale error
Gain error
Zero code error drift
TEST CONDITIONS
16-Bit monotonic
All zeroes loaded to DAC register
All ones loaded to DAC register
Gain temperature coefficient
OUTPUT CHARACTERISTICS (see Note 2)
Output voltage range
Output voltage settling time (full scale)
Slew rate
RL = 2 kΩ; 0 pF < CL < 200 pF
RL = 2 kΩ; CL = 500 pF
Capacitive load stability
Digital-to-analog glitch impulse
RL = ∞
RL = 2 kΩ
1 LSB change around major carry (see Note 3)
Digital feedthrough
DC output impedance
Short circuit current
AVDD = 5 V
AVDD = 3 V
Power-up time
Coming out of power-down mode, AVDD = 5 V
Coming out of power-down mode, AVDD = 3 V
NOTES: 1. Linearity calculated using a reduced code range of 485 to 64714. Output unloaded.
2. Assured by design and characterization, not production tested.
3. Specification for code changes at each N x 4096 code boundary.
MIN TYP
MAX UNIT
16
5
–0.15
±20
±5
±0.098
±1
20
–0.8
±0.8
Bits
%FSR
LSB
mV
%FSR
%FSR
µV/°C
ppm of
FSR/°C
2×VREFL
8
12
1
470
1000
20
0.5
1
50
20
2.5
5
VREFH
10
V
µs
V/µs
pF
nV−s
nV−s
Ω
mA
µs
2
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