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THS4511 Datasheet, PDF (14/25 Pages) Texas Instruments – WIDEBAND, LOW NOISE, LOW DISTORTION FULLY DIFFERENTIAL AMPLIFIER
THS4511
SLOS471 – SEPTEMBER 2005
TEST CIRCUITS
The THS4511 is tested with the following test circuits
built on the EVM. For simplicity, the power supply
decoupling is not shown – see the layout in the
application information section for recommendations.
Depending on the test conditions, component values
are changed per the following tables, or as otherwise
noted. The signal generators used are ac coupled
50-Ω sources and a 0.22-µF capacitor and a 49.9-Ω
resistor to ground are inserted across RIT on the
alternate input to balance the circuit.
Table 1. Gain Component Values
GAIN
0 dB
6 dB
RF
348 Ω
348 Ω
RG
340 Ω
165 Ω
RIT
56.2 Ω
61.9 Ω
Note the gain setting includes 50-Ω source im-
pedance. Components are chosen to achieve gain
and 50-Ω input termination.
Table 2. Load Component Values
RL
100 Ω
200 Ω
499 Ω
1k Ω
RO
25 Ω
86.6 Ω
237 Ω
487 Ω
ROT
open
69.8 Ω
56.2 Ω
52.3 Ω
Atten.
6 dB
16.8 dB
25.5 dB
31.8 dB
Note the total load includes 50-Ω termination by
the test equipment. Components are chosen to
achieve load and 50-Ω line termination through a
1:1 transformer.
Due to the voltage divider on the output formed by
the load component values, the amplifier's output is
attenuated. The column Atten in Table 2 shows the
attenuation expected from the resistor divider. When
using a transformer at the output as shown in
Figure 39, the signal will see slightly more loss, and
these numbers will be approximate.
Frequency Response
The circuit shown in Figure 38 is used to measure the
frequency response of the circuit.
A network analyzer is used as the signal source and
as the measurement device. The output impedance
of the network analyzer is 50 Ω. RIT and RG are
chosen to impedance match to 50 Ω, and to maintain
the proper gain. To balance the amplifier, a 0.22-µF
capacitor and 49.9-Ω resistor to ground are inserted
across RIT on the alternate input.
The output is probed using a high-impedance differ-
ential probe across the 100-Ω resistor. The gain is
referred to the amplifier output by adding back the
6-dB loss due to the voltage divider on the output.
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From VIN
50 W
Source
RG
RIT
0.22 mF
49.9 W
RG
RIT
RF
5V
THS4511
CM
49.9 W
49.9 W 100 W
Open
0.22 mF
Output Measured
Here With High
Impedance
Differential Probe
RF
Figure 38. Frequency Response Test Circuit
Distortion and 1dB Compression
The circuit shown in Figure 39 is used to measure
harmonic distortion, intermodulation distortion, and
1-db compression point of the amplifier.
A signal generator is used as the signal source and
the output is measured with a spectrum analyzer. The
output impedance of the signal generator is 50 Ω. RIT
and RG are chosen to impedance-match to 50 Ω, and
to maintain the proper gain. To balance the amplifier,
a 0.22-µF capacitor and 49.9-Ω resistor to ground are
inserted across RIT on the alternate input.
A low-pass filter is inserted in series with the input to
reduce harmonics generated at the signal source.
The level of the fundamental is measured, then a
high-pass filter is inserted at the output to reduce the
fundamental so that it does not generate distortion in
the input of the spectrum analyzer.
The transformer used in the output to convert the
signal from differential to single ended is an
ADT1-1WT. It limits the frequency response of the
circuit so that measurements cannot be made below
approximately 1MHz.
From VIN
50 W
Source
RG
RIT
RG
RF
5V
THS4511
RO
1:1 VOUT To 50 W
Test
RO
ROT
Equipment
0.22 mF
RIT
49.9 W
CM
RF
Open
0.22 mF
Figure 39. Distortion Test Circuit
The 1-dB compression point is measured with a
spectrum analyzer with 50-Ω double termination or
100-Ω termination as shown in Table 2. The input
power is increased until the output is 1 dB lower than
expected. The number reported in the table data is
the power delivered to the spectrum analyzer input.
Add 3 dB to refer to the amplifier output.
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