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TC215 Datasheet, PDF (12/19 Pages) Texas Instruments – 1024- × 1024-PIXEL CCD IMAGE SENSOR
TC215
1024- × 1024-PIXEL CCD IMAGE SENSOR
SOCS014B – AUGUST 1989 – REVISED DECEMBER 1991
electrical characteristics over recommended operating ranges of supply voltage and free-air
temperature
PARAMETER
MIN TYP†
MAX UNIT
Dynamic range (see Note 2)
60
dB
Charge conversion factor
6
µV/e
Charge transfer efficiency (see Note 3)
0.99990
Signal response delay time, τ (see Note 4 and Figure 16)
18
20
22
ns
Gamma (see Note 5)
0.89
0.94
0.99
Output resistance
1000
Ω
Noise voltage
1/f noise (5 kHz)
Random noise (f = 100 kHz)
0.1
µV/√Hz
0.08
Noise equivalent signal
60
electrons
ADB (see Note 6)
20
Rejection ratio at 10 MHz
SRGn (see Note 7)
40
dB
ABGn (see Note 8)
30
Supply current
9 mA
IAG1, IAG2
15000
Input capacitance, Ci
ABG1, ABG2
TRG
8000
pF
350
SRG1, SRG2
200
† All typical values are at TA = 25 °C.
NOTES: 2. Dynamic range is – 20 times the logarithm of the mean noise signal divided by the saturation output signal.
3. Charge transfer efficiency is one minus the charge loss per transfer in the output register (1046 transfers). The test is performed
in the dark using an electrical input signal.
4. Signal-response delay time is the time between the falling edge of the SRG clock pulse and the output signal valid state.
5. Gamma (γ) is the value of the exponent in the equation below for two points on the linear portion of the transfer function curve (this
ǒ Ǔ + ǒ Ǔ value represents points near saturation):
g
Exposure (2)
Output signal (2)
Exposure (1)
Output signal (1)
6. ADB rejection ratio is – 20 times the logarithm of the ac amplitude on OUTn divided by the ac amplitude on ADB.
7. SRGn rejection ratio is – 20 times the logarithm of the ac amplitude on OUTn divided by the ac amplitude on SRGn.
8. ABGn rejection ratio is – 20 times the logarithm of the ac amplitude on OUTn divided by the ac amplitude on ABGn.
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