TIBPAL22V10-7C Datasheet, PDF (10/17 Pages) Texas Instruments – HIGH-PERFORMANCE IMPACT-X E PROGRAMMABLE ARRAY LOGIC CIRCUITS

TIBPAL22V10-7C
HIGH-PERFORMANCE IMPACT-X ™ PROGRAMMABLE ARRAY LOGIC CIRCUITS
SRPS014D – D3520, AUGUST 1990 – REVISED NOVEMBER 1995
preload procedure for registered outputs (see Notes 3 and 4)
The output registers can be preloaded to any desired state during device testing. This permits any state to be
tested without having to step through the entire state-machine sequence. Each register is preloaded individually
by following the steps given below:
Step 1. With V_CC at 5 V and pin 1 at V_IL, raise pin 13 to V_IHH.
Step 2. Apply either V_IL or V_IH to the output corresponding to the register to be preloaded.
Step 3. Pulse pin 1, clocking in preload data.
Step 4. Remove output voltage, then lower pin 13 to V_IL. Preload can be verified by observing the voltage
level at the output pin.
Pin 13
Pin 1
tsu
td
td
tw
VIHH
VIL
VIH
VIL
Registered I/O
Input
VIH
VOH
Output
VIL
VOL
Figure 2. Preload Waveforms
NOTES: 3. Pin numbers shown are for the NT package only. If chip-carrier socket adapter is not used, pin numbers must be changed accordingly.
4. t_d = t_su = t_w = 100 ns to 1000 ns. V_IHH = 10.25 V to 10.75 V.
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