SMJ320MCM42C Datasheet, PDF (1/16 Pages) Texas Instruments – DUAL SMJ320C40 MULTICHIP MODULE

D Performance:
– 80 Million Floating-Point Operations Per
Second (MFLOPS) With 496-MBps-Burst
I/O Rate for 40-MHz Modules
– Zero-Wait-State Local Memory for Each
Processor
D Organization:
– 128K-Word × 32-Bit Static
Random-Access Memory (SRAM)
(SMJ320MCM42D)
– 256K-Word × 32-Bit SRAM
(SMJ320MCM42C)
D Compliant With MIL-PRF-38535 QML
D Dual ’C40 Performance With Local Memory
Requiring Only 8.7 Square Inches of Board
Space
D Enhanced Performance Offered By
Multichip-Module Solution
– SMJ320MCM42C
– 67% Reduction in Number of
Interconnects
– 54% Reduction (Minimum) in Board
Area
– Estimated 38% Reduction in Power
Dissipation Due to Reduced Parasitic
Capacitance and Interconnect Lengths
– SMJ320MCM42D
– 56% Reduction in Number of
Interconnects
– 30% Reduction (Minimum) in Board
Area
– Estimated 20% Reduction in Power
Dissipation Due to Reduced Parasitic
Capacitance and Interconnect Lengths
D Four Memory Ports for High Data
Bandwidth
– Two Full 2G-Word External Buses
D Two Internal Buses Mapped to Memory
– 128K-Word × 32-Bit SRAM for Each ’C40
Local Bus (SMJ320MCM42D)
– 256K-Word × 32-Bit SRAM for Each ’C40
Local Bus (SMJ320MCM42C)
D Ten External Communication Ports for
Direct Processor-to-Processor
Communication
SMJ320MCM42C, SMJ320MCM42D
DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
HFN PACKAGE‡
( TOP VIEW )
408
307
1
306
102
205
103
204
‡ _{Terminal assignment information is provided by the terminal}
assignments table. Package is shown for pinout reference only.
D IEEE-1149.1^† (JTAG) Boundary-Scan
Compatible
D 408-Lead Ceramic Quad Flatpack Package
(HFN Suffix)
D Operating Free-Air Temperature Ranges:
– 55°C to 125°C . . . (Military)
0°C to 70°C . . . (Commercial)
D Communication-Port Connection Provided
Between ’C40s for Interprocessor
Communication
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
† _{IEEE Standard 1149.1–1990 Standard Test-Access Port and Boundary-Scan Architecture}
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
• POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
Copyright © 2000, Texas Instruments Incorporated
On products compliant to MIL-STD-PRF-38535, all parameters
are tested unless otherwise noted. On all other products,
production processing does not necessarily include testing of all
parameters.
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