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BQ4010_07 Datasheet, PDF (1/18 Pages) Texas Instruments – 8 k x 8 NONVOLATILE SRAM (5 V, 3.3 V)
bq4010/Y/LY
www.ti.com
SLUS116A – MAY 1999 – REVISED APRIL 2007
8 k × 8 NONVOLATILE SRAM (5 V, 3.3 V)
FEATURES
• Data Retention for at least 10 Years Without
Power
• Automatic Write-Protection During
Power-up/Power-down Cycles
• Conventional SRAM Operation, Including
Unlimited Write Cycles
• Internal Isolation of Battery before Power
Application
• 5-V or 3.3-V Operation
• Industry Standard 28-Pin DIP Pinout or
34-Pin LIFETIME LITHIUM™ SMD Pinout
• Snap-on, Replaceable Lithium Battery
for SMD Device
(Device Number: bq401BATCAP)
GENERAL DESCRIPTION
The CMOS bq4010/Y/LY is a nonvolatile 65,536-bit
static RAM organized as 8,192 words by 8 bits. The
integral control circuitry and lithium energy source
provide reliable nonvolatility coupled with the
unlimited write cycles of standard SRAM.
The control circuitry constantly monitors the single
supply for an out-of-tolerance condition. When VCC
falls out of tolerance, the SRAM is unconditionally
write-protected to prevent an inadvertent write
operation.
At this time the integral energy source is switched on
to sustain the memory until after VCC returns valid.
The bq4010/Y/LY uses extremely low standby
current CMOS SRAMs, coupled with small lithium
coin cells to provide nonvolatility without long
write-cycle times and the write-cycle limitations
associated with EEPROM.
The bq4010/Y/LY requires no external circuitry and is
compatible with the industry-standard 64-Mb SRAM
pinout.
PIN CONNECTIONS
28−Pin DIP Module
(TOP VIEW)
NC 1
A12 2
A7 3
A6 4
A5 5
A4 6
A3 7
A2 8
A1 9
A0 10
DQ0 11
DQ1 12
DQ2 13
VSS 14
28 VCC
27 WE
26 NC
25 A8
24 A9
23 A11
22 OE
21 A10
20 CE
19 DQ7
18 DQ6
17 DQ5
16 DQ4
15 DQ3
NC/BW 1
NC 2
NC 3
NC/RST 4
VCC 5
WE 6
OE 7
CE 8
DQ7 9
DQ6 10
DQ5 11
DQ4 12
DQ3 13
DQ2 14
DQ1 15
DQ0 16
VSS 17
34−Pin
Lifetime Lithium Module
(TOP VIEW)
34 NC
33 NC
32 NC
31 NC
30 A12
29 A11
28 A10
27 A9
26 A8
25 A7
24 A6
23 A5
22 A4
21 A3
20 A2
19 A1
18 A0
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1999–2007, Texas Instruments Incorporated