STB33N60DM2 Datasheet, PDF (9/20 Pages) STMicroelectronics – Extremely high dv/dt ruggedness

STB33N60DM2, STP33N60DM2, STW33N60DM2
3
Test circuits
Figure 18: Test circuit for resistive load
switching times
Test circuits
Figure 19: Test circuit for gate charge
behavior
Figure 20: Test circuit for inductive load
switching and diode recovery times
Figure 21: Unclamped inductive load test
circuit
Figure 22: Unclamped inductive waveform
Figure 23: Switching time waveform
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