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STB3NA60-1 Datasheet, PDF (3/9 Pages) STMicroelectronics – N - CHANNEL ENHANCEMENT MODE FAST POWER MOS TRANSISTOR
STB3NA60-1
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symb ol
td(on)
tr
(di/ dt) on
Qg
Qgs
Qgd
P a ram et er
Turn-on T ime
Rise Time
Turn-on Current Slope
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Test Conditions
VDD = 300 V
ID = 1.5 A
RG = 18 Ω
VGS = 10 V
(see test circuit, figure 3)
VDD = 400 V
ID = 3 A
RG = 18 Ω
VGS = 10 V
(see test circuit, figure 5)
ID = 3 A
VGS = 10 V
VDD = Max Rating x 0.8
Min.
Typ .
14
25
300
22
6
9
M a x.
20
35
30
Unit
ns
ns
A/µs
nC
nC
nC
SWITCHING OFF
Symb ol
tr(Vo f f)
tf
tc
P a ram et er
Off-voltage Rise Time
Fall Time
Cross-over T ime
Test Conditions
VDD = 480 V
ID = 3 A
RG = 18 Ω
VGS = 10 V
(see test circuit, figure 5)
Min.
Typ .
13
24
12
M a x.
18
34
17
Unit
ns
ns
ns
SOURCE DRAIN DIODE
Symb ol
P a ram et er
Test Conditions
ISD
ISDM (•)
Source-drain Current
Source-drain Current
( pu ls ed)
VSD (∗) Forward O n Volt age
ISD = 2.9 A
VGS = 0
trr
Reverse Recovery
Time
Qrr
Reverse Recovery
Charge
ISD = 3 A
VDD = 100 V
di/dt = 100 A/µs
Tj = 150 oC
(see test circuit, figure 5)
IRRM
Reverse Recovery
Cu r re nt
(∗) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
(•) Pulse width limited by safe operating area
Min.
Typ .
460
5.6
24
M a x.
2.9
11.6
1.5
Unit
A
A
V
ns
µC
A
Safe Operating Area
Thermal Impedance
3/9