STM32F745XX Datasheet, PDF (137/227 Pages) STMicroelectronics – ARM-based Cortex-M7 32b MCU+FPU, 462DMIPS, up to 1MB Flash/320+16+ 4KB RAM, USB OTG HS/FS, ethernet, 18 TIMs, 3 ADCs, 25 com itf, cam & LCD

STM32F745xx STM32F746xx
Electrical characteristics
5.3.15
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the ANSI/ESDA/JEDEC JS-001-2012 and ANSI/ESD S5.3.1-2009 standards.
Symbol
Table 53. ESD absolute maximum ratings
Ratings
Conditions
Class
Maximum
value⁽¹⁾
Unit
V_ESD(HBM)
Electrostatic discharge
voltage (human body model)
T_A = +25 °C conforming to
ANSI/ESDA/JEDEC JS-001-2012
2
2000
T_A = +25 °C conforming to ANSI/ESD
V_ESD(CDM)
Electrostatic discharge
voltage (charge device model)
S5.3.1-2009, LQFP100, LQFP144,
LQFP176, LQFP208, WLCSP143,
UFBGA176, TFBGA100 and TFBGA216
C3
250
V
packages
1. Guaranteed by characterization results.
Static latchup
Two complementary static tests are required on six parts to assess the latchup
performance:
• A supply overvoltage is applied to each power supply pin
• A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78A IC latchup standard.
Symbol
LU
Parameter
Static latch-up class
Table 54. Electrical sensitivities
Conditions
T_A = +105 °C conforming to JESD78A
Class
II level A
5.3.16
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V_SS or
above V_DD (for standard, 3 V-capable I/O pins) should be avoided during normal product
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
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