SPC56EL60L5 Datasheet, PDF (122/160 Pages) STMicroelectronics – 32-bit Power Architecture® microcontroller for automotive SIL3/ASILD chassis and safety applications

Electrical characteristics
SPC56XL60/54
Table 29. Flash memory module life
No. Symbol
Parameter
Value
Unit
Minimum Typical Maximum
Number of program/erase cycles per block for 16 KB,
1 P/E C 48 KB, and 64 KB blocks over the operating temperature 100000
—
range⁽¹⁾
— cycles
Number of program/erase cycles per block for 128 KB
2 P/E C and 256 KB blocks over the operating temperature
range⁽¹⁾
1000 100000⁽²⁾ — cycles
Minimum data retention at 85 °C average ambient
temperature⁽³⁾
3 Retention C Blocks with 0–1,000 P/E cycles
Blocks with 1,001–10,000 P/E cycles
Blocks with 10,001–100,000 P/E cycles
20
—
—
years
10
—
—
5
—
—
1. Operating temperature range is T_J from –40 °C to 150 °C. Typical endurance is evaluated at 25 °C.
2. Typical P/E cycles is 100,000 cycles for 128 KB and 256 KB blocks.
3. Ambient temperature averaged over duration of application, not to exceed product operating temperature range.
3.17 SWG electrical characteristics
Table 30. MPC5643L SWG Specifications
Symbol
Parameter
Minimum
Value
Typical
Maximum
T
Input clock
12 MHz
16 MHz
20 MHz
T
Frequency Range
1kHz
—
50 kHz
T
Peak to Peak⁽¹⁾
0.4 V
—
2.0V
T
Peak to Peak variation⁽²⁾
-6%
—
6%
T
Common Mode⁽³⁾
—
1.3 V
—
T
Common Mode variation
-6%
—
6%
T
SiNAD⁽⁴⁾
45 dB
—
—
T
Load C
25 pF
—
100 pF
T
Load I
0 µA
—
100 µA
T
ESD Pad Resistance⁽⁵⁾
230 Ω
—
360 Ω
1. Peak to Peak value is measured with no R or I load.
2. Peak to Peak excludes noise, SiNAD must be considered.
3. Common mode value is measured with no R or I load.
4. SiNAD is measured at Max Peak to Peak voltage.
5. Internal device routing resistance. ESD pad resistance is in series and must be considered for max Peak to Peak voltages,
depending on application I load and/or R load.
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