EFM32TG210 Datasheet, PDF (58/66 Pages) Silicon Laboratories – Output state retention and wake-up from Shutoff Mode

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Added rising POR level and corrected Thermometer output gradient in Electrical Characteristics section.
Updated Minimum Load Capacitance (C_LFXOL) Requirement For Safe Crystal Startup.
Added Gain error drift and Offset error drift to ADC table.
Added reference to errata document.
7.9 Revision 0.92
July 22nd, 2011
Updated current consumption numbers from latest device characterization data.
Updated OPAMP electrical characteristics.
Made ADC plots render properly in Adobe Reader.
7.10 Revision 0.91
February 4th, 2011
Corrected max DAC sampling rate.
Increased max storage temperature.
Added data for <150°C and <70°C on Flash data retention.
Changed latch-up sensitivity test description.
Added IO leakage current.
Added Flash current consumption.
Updated HFRCO data.
Updated LFRCO data.
Added graph for ADC Absolute Offset over temperature.
Added graph for ADC Temperature sensor readout.
Updated OPAMP electrical characteristics.
7.11 Revision 0.90
December 1st, 2010
New peripherals added to pinout, including LESENSE and OpAmps.
7.12 Revision 0.50
May 25th, 2010
Block diagram update.
7.13 Revision 0.40
March 26th, 2010
2015-03-06 - EFM32TG210FXX - d0012_Rev1.40
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